Inventor
Nikila Krishnamoorthy
Inventor
Bangalore, IN
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables75%
G06JHybrid computing arrangements13%
G11CStatic stores13%
PatentTitleYear
8,458,541'System and method for debugging scan chains'20137,421,634'Sequential scan based techniques to test interface between modules designed to operate at different frequencies'20087,213,184'Testing of modules operating with different characteristics of control signals using scan based techniques'20077,134,061'At-speed ATPG testing and apparatus for SoC designs having multiple clock domain using a VLCT test platform'20067,120,842'Mechanism to enhance observability of integrated circuit failures during burn-in tests'20066,925,408'Mixed-signal core design for concurrent testing of mixed-signal, analog, and digital components'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2008Patents assigned to TEXAS INSTRUMENTS INC (5)· patent assignee history
2005–2006Based in Karnataka, IN· patent location history
2006–2008Based in Bangalore, IN· patent location history
2013Patents assigned to CHAUDHARY ABHISHEK (1)· patent assignee history
2013Patents assigned to CHAUHAN SAURABH (1)· patent assignee history
2013Patents assigned to FREESCALE SEMICONDUCTOR INC (1)· patent assignee history
2013Patents assigned to JAIN SANDEEP (1)· patent assignee history
2013Based in Chennai, IN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TEXAS INSTRUMENTS INC | 5 | 2005–2008 |
| CHAUDHARY ABHISHEK | 1 | 2013 |
| CHAUHAN SAURABH | 1 | 2013 |
| FREESCALE SEMICONDUCTOR INC | 1 | 2013 |
| JAIN SANDEEP | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Bangalore, IN | 3 | 2006–2008 |
| Karnataka, IN | 2 | 2005–2006 |
| Chennai, IN | 1 | 2013 |