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Inventor

Yoichi Kubota

Inventor
Pleasanton, CA, US

Overview

48→
Patents
1981–2021
Patent span
Electricity
Primary field (CPC H)

Patents· 48 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Wprimary
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1016%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light11%
G01DMeasuring not specially adapted for a specific variable9%
H04NPictorial communication, e.g. television9%
B81BMicrostructural devices or systems, e.g. micromechanical devices7%
B81CProcesses or apparatus specially adapted for the manufacture or treatment of microstructural devices or systems6%
G03GElectrography5%
H05KPrinted circuits5%
G01NInvestigating or analysing materials by determining their chemical or physical properties4%
Y10TTechnical subjects covered by former us classification4%
PatentTitleYear
11,134,159Spectral characteristic acquisition device, image forming apparatus, and image forming apparatus management system202110,946,514Controller, work control unit, multi-axis motion control unit, and drive control unit202110,894,320Robot system and robot control method202110,594,905Spectral characteristic obtaining apparatus, image forming apparatus, and image forming system202010,564,038Spectral characteristic acquiring apparatus, image forming apparatus, image forming system, image forming apparatus management system, and image forming apparatus management method20209,856,135'Microelectronic interconnect element with decreased conductor spacing'20189,677,938'Spectral characteristic acquisition device, image evaluation device, and image formation apparatus'20179,524,947'Microelectronic interconnect element with decreased conductor spacing'20169,224,080'Spectral characteristic acquisition device, image evaluation device, and image formation apparatus'20159,197,761'Spectral characteristic acquisition apparatus, image evaluation apparatus, and image forming apparatus'20158,964,176'Spectrometer, and image evaluating unit and image forming device incorporating the same'20158,908,176'Apparatus and method for obtaining spectral characteristics'20148,900,464'Method of making a microelectronic interconnect element with decreased conductor spacing'20148,879,057'Spectral characteristic acquiring apparatus, spectral characteristic acquiring method and image evaluating apparatus'20148,755,046'Spectrometer, and image evaluating unit and image forming device incorporating the same'20148,641,913'Fine pitch microcontacts and method for forming thereof'20148,604,348'Method of making a connection component with posts and pads'20138,593,628'Spectral characteristics estimation device, image forming apparatus having the same, and spectral characteristics estimation method'20138,559,005'Spectral characteristic measuring device and image forming apparatus'20138,472,019'Spectroscopic characteristics acquisition unit, image evaluation unit, and image forming apparatus'20138,461,460'Microelectronic interconnect element with decreased conductor spacing'20138,329,581'Microelectronic packages and methods therefor'20128,046,912'Method of making a connection component with posts and pads'20117,999,397'Microelectronic packages and methods therefor'20117,811,909'Production of a hexagonal boron nitride crystal body capable of emitting out ultraviolet radiation'20107,754,537'Manufacture of mountable capped chips'20107,745,943'Microelectonic packages and methods therefor'20107,659,617'Substrate for a flexible microelectronic assembly and a method of fabricating thereof'20107,554,206'Microelectronic packages and methods therefor'20097,495,179'Components with posts and pads'20097,462,932'Manufacture of mountable capped chips'20087,453,157'Microelectronic packages and methods therefor'20087,176,043'Microelectronic packages and methods therefor'20077,176,506'High frequency chip packages with connecting elements'20077,071,547'Assemblies having stacked semiconductor chips and methods of making same'20065,612,602'Device and method comprising a motor and/or a digital signal processor, means for supplying signals of a plurality of channels in serial form, or means for causing an actuator to abut an object'19975,198,873'Encoder utilizing interference using multi-mode semiconductor laser'19935,066,130'Displacement measuring apparatus'19915,038,032'Encoder incorporating a displaceable diffraction grating'19915,017,777'Diffracted beam encoder'19915,000,542'Optical type encoder'19914,998,798'Encoder having long length measuring stroke'19914,979,826'Displacement measuring apparatus'19904,975,570'Rotary encoder using multiple diffracted beams having co-incident paths'19904,970,388'Encoder with diffraction grating and multiply diffracted light'19904,912,491'Apparatus for forming superimposed images'19904,903,067'Multiimage forming apparatus'19904,247,194'Control system for electrophotographic copying machine'1981

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1981–2021Based in Tokyo, JP· patent location history
1990–1997Patents assigned to CANON KK (12)· patent assignee history
1990–1991Based in Kawasaki, JP· patent location history
1993–1997Based in Yokohama, JP· patent location history
2006–2014Patents assigned to TESSERA INC (15)· patent assignee history
2006–2018Based in Pleasanton, CA, US· patent location history
2012–2021Patents assigned to KUBOTA YOICHI (17)· patent assignee history
2013–2021Patents assigned to RICOH CO LTD (13)· patent assignee history
2013–2021Patents assigned to SHIMBO KOHEI (13)· patent assignee history
2021Based in Kitakyushu, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
KUBOTA YOICHIself172012–2021
TESSERA INC152006–2014
RICOH CO LTD132013–2021
SHIMBO KOHEI132013–2021
CANON KK121990–1997
Locations
LocationPatentsSpan
Pleasanton, California, US182006–2018
Tokyo, JP141981–2021
Kawasaki, JP101990–1991
Kitakyushu, JP22021
Yokohama, JP21993–1997