Inventor

Toshihito Kimura

Inventor

Kanagawa, JP

Overview

46→

Patents

1991–2020

Patent span

Physics

Primary field (CPC G)

Patents· 46 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary

G01NInvestigating or analysing materials by determining their chemical or physical properties61%

B01LChemical or physical laboratory apparatus for general use10%

G02BOptical elements, systems or apparatus10%

B04BCentrifuges3%

G01TMeasurement of nuclear or x-radiation3%

Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests3%

A61MDevices for introducing media into, or onto, the body2%

B05DProcesses for applying fluent materials to surfaces, in general2%

B82YSpecific uses or applications of nanostructures2%

C09BOrganic dyes or closely-related compounds for producing dyes, e.g. pigments2%

PatentTitleYear

10,842,928Adapter for blood dispensing2020 10,639,625Pipette tip and liquid injection method2020 10,161,935Test substance measurement kit and test substance measurement method2018 10,101,318Measurement apparatus2018 10,092,910Container for centrifugal separation and its production method2018 9,551,661'Assay chip'2017 8,680,486'Biological molecule detecting apparatus and biological molecule detecting method'2014 8,581,213'Biological molecule detecting apparatus and biological molecule detecting method'2013 8,477,312'Total reflection illuminated sensor chip, method for producing the total reflection illuminated sensor chip, and sensing method using the total reflection illuminated sensor chip'2013 8,421,036'Optical signal detection method, apparatus, sample cell and kit'2013 8,193,516'Sensing apparatus'2012 8,107,071'Method for detecting molecular analysis light, and apparatus and sample plate for use with the same'2012 8,102,533'Total reflection illuminated sensor chip'2012 8,097,862'Fluorescence detecting method and fluorescence detecting apparatus'2012 8,026,494'Flourescence detecting method and fluorescence detecting apparatus'2011 7,944,563'Sensing apparatus'2011 7,885,769'Screening method and apparatus'2011 7,830,521'Detection apparatus, detection method, and optically transparent member'2010 7,812,955'Sample analysis apparatus and analysis method'2010 7,615,759'Fluorescence analysis apparatus'2009 7,612,349'Surface plasmon enhanced fluorescence sensor'2009 7,450,236'Measuring apparatus and sensor unit for same'2008 7,382,461'Analysis method and apparatus utilizing attenuated total reflection'2008 7,365,853'Measuring method and measuring apparatus utilizing attenuated total reflection'2008 7,317,534'Measuring method and system'2008 7,187,446'Measuring apparatus'2007 7,187,444'Measuring method and apparatus using attenuation in total internal reflection'2007 7,102,754'Measuring method and apparatus using attenuation in total internal reflection'2006 7,075,654'Measuring apparatus and measuring chip'2006 7,030,988'Measuring apparatus and measuring chip'2006 6,891,620'Measuring plate'2005 6,885,454'Measuring apparatus'2005 6,791,691'Measuring method and apparatus using attenuation in total internal reflection'2004 6,762,840'Image information reading apparatus designed to maintain light amount to be detected at uniform level'2004 6,697,158'Measuring apparatus utilizing attenuated total reflection'2004 6,670,198'Test piece and system for reading out image information from the test piece'2003 6,577,453'Image reading apparatus'2003 6,493,459'Image reading apparatus'2002 6,458,601'Test piece and system for reading out image information from the test piece'2002 6,417,924'Surface plasmon sensor obtaining total reflection break angle based on difference from critical angle'2002 6,326,628'Image reading apparatus'2001 5,665,962'Image reader and image recorder with interposed photochromic material for reducing flare'1997 5,260,569'Scanning microscope and scanning mechanism'1993 5,241,364'Confocal scanning type of phase contrast microscope and scanning microscope'1993 5,168,157'Scanning microscope with means for detecting a first and second polarized light beams along first and second optical receiving paths'1992 5,065,008'Scanning microscope and scanning mechanism for the same'1991

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1991–2007Patents assigned to FUJI PHOTO FILM CO LTD (21)· patent assignee history

1991–2020Based in Kanagawa, JP· patent location history

2001–2007Based in Kaisei-machi, JP· patent location history

2008–2020Patents assigned to FUJIFILM CORP (25)· patent assignee history

2009–2020Based in Ashigarakami-gun, JP· patent location history

2012–2013Patents assigned to KIMURA TOSHIHITO (6)· patent assignee history

2013Patents assigned to HORII KAZUYOSHI (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
FUJIFILM CORP	25	2008–2020
FUJI PHOTO FILM CO LTD	21	1991–2007
KIMURA TOSHIHITOself	6	2012–2013
HORII KAZUYOSHI	1	2013

Locations

Location	Patents	Span
Kanagawa, JP	18	1991–2020
Ashigarakami-gun, JP	15	2009–2020
Kaisei-machi, JP	13	2001–2007