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Inventor

Shunzi Maeda

Inventor
Yokohama, JP

Overview

6→
Patents
2004–2013
Patent span
Physics
Primary field (CPC G)

Patents· 6 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties100%
PatentTitleYear
8,451,439'Apparatus and method for inspecting pattern'20138,149,395'Apparatus and method for inspecting pattern'20127,911,601'Apparatus and method for inspecting pattern'20117,446,866'Apparatus and method for inspecting pattern'20087,081,953'Apparatus and method for inspecting pattern'20066,831,737'Apparatus and method for inspecting pattern'2004

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2004–2013Patents assigned to HITACHI LTD (6)· patent assignee history
2004–2013Based in Yokohama, JP· patent location history
2012–2013Patents assigned to MAEDA SHUNZI (2)· patent assignee history
2012–2013Patents assigned to NAKATA TOSHIHIKO (2)· patent assignee history
2012–2013Patents assigned to SHIMODA ATSUSHI (2)· patent assignee history
2012–2013Patents assigned to UTO SACHIO (2)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI LTD62004–2013
MAEDA SHUNZIself22012–2013
NAKATA TOSHIHIKO22012–2013
SHIMODA ATSUSHI22012–2013
UTO SACHIO22012–2013
Locations
LocationPatentsSpan
Yokohama, JP62004–2013