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Inventor

Yun Dong

Inventor
Shanghai, CN

Overview

14→
Patents
2013–2020
Patent span
Physics
Primary field (CPC G)

Patents· 14 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

A61Bprimary
A61BDiagnosis18%
G01TMeasurement of nuclear or x-radiation15%
G01NInvestigating or analysing materials by determining their chemical or physical properties10%
G06TImage data processing or generation, in general10%
G06FElectric digital data processing8%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein5%
G06VImage or video recognition or understanding5%
G09GArrangements or circuits for control of indicating devices using static means to present variable information5%
G06KGraphical data reading3%
G16HHealthcare informatics, i.e. information and communication technology [ict] specially adapted for the handling or processing of medical or healthcare data3%
PatentTitleYear
10,732,305System and method for image reconstruction in positron emission tomography202010,578,753Apparatus, method and system for sparse detector202010,535,166System and method for reconstructing ECT image202010,454,279Power system and control method thereof201910,365,385Apparatus, method and system for sparse detector201910,067,245Apparatus, method and system for sparse detector20189,990,718System and method for reconstructing ECT image20189,966,864Electronic apparatus and control method of electronic apparatus20189,864,072'Apparatus, method and system for sparse detector'20189,196,208'Gate drive method in which a flickering phenomen is eliminated and gate drive device of liquid crystal display'20159,019,462'Array substrate and method for manufacturing the same, and display device'20158,786,305'Test circuit and test method for detecting electrical defect in TFT-LCD'20148,503,753'System and method for triangular interpolation in image reconstruction for PET'20138,483,992'Analytical computation of geometric normalization factor for TOF-PET'2013

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2013–2015Patents assigned to DONG YUN (5)· patent assignee history
2013Based in Chicago, IL, US· patent location history
2013Based in Mundelein, IL, US· patent location history
2014–2015Patents assigned to BEIJING BOE OPTOELECTRONICS (3)· patent assignee history
2014–2015Based in Beijing, CN· patent location history
2015Patents assigned to QIN WEI (2)· patent assignee history
2018–2020Patents assigned to SHANGHAI UNITED IMAGING HEALTHCARE CO LTD (7)· patent assignee history
2018–2019Patents assigned to DELTA ELECTRONICS INC (2)· patent assignee history
2018–2020Based in Shanghai, CN· patent location history
2018–2019Based in Taoyuan, TW· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
SHANGHAI UNITED IMAGING HEALTHCARE CO LTD72018–2020
DONG YUNself52013–2015
BEIJING BOE OPTOELECTRONICS32014–2015
DELTA ELECTRONICS INC22018–2019
QIN WEI22015
Locations
LocationPatentsSpan
Shanghai, CN72018–2020
Beijing, CN32014–2015
Taoyuan, TW22018–2019
Chicago, Illinois, US12013
Mundelein, Illinois, US12013