Inventor
Leonid Velikov
Inventor
San Carlos, CA, US
Overview
Patents· 32 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus33%
H01JElectric discharge tubes or discharge lamps26%
G01BMeasuring length, thickness or similar linear dimensions12%
C23CCoating metallic material7%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein7%
H04BTransmission7%
G03HHolographic processes or apparatus5%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices2%
H05HPlasma technique2%
PatentTitleYear
10,168,668Method of forming a rarefied hologram for video imaging and 3D lithography20199,164,219'Frontlight unit for reflective displays'20159,143,235'Multicore chip with holographic optical interconnects'20159,036,994'Method of optical interconnection of data-processing cores on a chip'20158,870,382'Method of reducing speckles in liquid-crystal display with coherent illumination'20148,861,057'Speckle-reduced laser illumination device'20148,854,710'Method of laser illumination with reduced speckling'20148,797,620'Autostereoscopic display assembly based on digital semiplanar holography'20148,773,613'Liquid-crystal display with coherent illumination and reduced speckling'20148,596,846'Frontlight unit for enhancing illumination of a reflective display'20138,585,268'Light-guide panel for display with laser backlight'20137,415,210'Bidirectional optical signal multiplexer/demultiplexer'20087,187,502'Compact optical assembly for imaging a remote object'20077,106,529'Flat wide-angle lens system'20066,989,675'Method and apparatus for precision measurement of film thickness'20066,980,379'Flat wide-angle objective'20056,939,058'Optical module for high-speed bidirectional transceiver'20056,891,380'System and method for measuring characteristics of materials with the use of a composite sensor'20056,842,025'Apparatus and method for multiple identical continuous records of characteristics on the surface of an object after selected stages of manufacture and treatment'20056,815,958'Method and apparatus for measuring thickness of thin films with improved accuracy'20046,801,044'Universal electromagnetic resonance system for detecting and measuring local non-uniformities in metal and non-metal objects'20046,250,250'Multiple-cell source of uniform plasma'20016,246,059'Ion-beam source with virtual anode'20016,242,749'Ion-beam source with uniform distribution of ion-current density on the surface of an object being treated'20016,238,526'Ion-beam source with channeling sputterable targets and a method for channeled sputtering'20016,236,163'Multiple-beam ion-beam assembly'20016,214,183'Combined ion-source and target-sputtering magnetron and a method for sputtering conductive and nonconductive materials'20016,153,067'Method for combined treatment of an object with an ion beam and a magnetron plasma with a combined magnetron-plasma and ion-beam source'20006,130,507'Cold-cathode ion source with propagation of ions in the electron drift plane'20006,049,086'Large area silent discharge excitation radiator'20006,037,717'Cold-cathode ion source with a controlled position of ion beam'20006,002,208'Universal cold-cathode type ion source with closed-loop electron drifting and adjustable ion-emitting slit'1999Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1999–2001Patents assigned to ADVANCED ION TECHNOLOGY INC (7)· patent assignee history
1999–2019Based in San Carlos, CA, US· patent location history
2013–2019Patents assigned to VELIKOV LEONID (9)· patent assignee history
2013–2015Patents assigned to IVONIN IGOR (8)· patent assignee history
2013–2019Patents assigned to YANKOV VLADIMIR (8)· patent assignee history
2013–2014Patents assigned to GOLTSOV ALEXANDER (7)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| VELIKOV LEONIDself | 9 | 2013–2019 |
| IVONIN IGOR | 8 | 2013–2015 |
| YANKOV VLADIMIR | 8 | 2013–2019 |
| ADVANCED ION TECHNOLOGY INC | 7 | 1999–2001 |
| GOLTSOV ALEXANDER | 7 | 2013–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| San Carlos, California, US | 32 | 1999–2019 |