Inventor
Naoki Ikeuchi
Inventor
Amagasaki, JP
Overview
Patents· 13 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Pprimary
G01PMeasuring linear or angular speed, acceleration, deceleration, or shock17%
G01CMeasuring distances, levels or bearings14%
G01RMeasuring electric variables14%
G01NInvestigating or analysing materials by determining their chemical or physical properties11%
H04RLoudspeakers, microphones, gramophone pick-ups or like acoustic electromechanical transducers11%
B81CProcesses or apparatus specially adapted for the manufacture or treatment of microstructural devices or systems9%
B81BMicrostructural devices or systems, e.g. micromechanical devices6%
G01HMeasurement of mechanical vibrations or ultrasonic, sonic or infrasonic waves6%
B82YSpecific uses or applications of nanostructures3%
G01DMeasuring not specially adapted for a specific variable3%
PatentTitleYear
8,141,426'Displacement measurement apparatus for microstructure and displcement measurement method thereof'20128,082,124'Method and system for diagnosing abnormal plasma discharge'20117,726,190'Device, method and program for inspecting microstructure'20107,428,841'Acceleration sensor and inclination-detecting method'20087,383,732'Device for inspecting micro structure, method for inspecting micro structure and program for inspecting micro structure'20087,348,788'Probing card and inspection apparatus for microstructure'20087,034,551'Electrostatic capacitance detection circuit and microphone device'20067,023,223'Impedance measuring circuit and capacitance measuring circuit'20067,019,540'Electrostatic capacitance detection circuit and microphone device'20067,005,865'Circuit and method for impedance detection'20066,931,928'Microstructure with movable mass'20056,438,243'Vibration wave detector'20026,223,601'Vibration wave detecting method and vibration wave detector'2001Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2001–2002Patents assigned to SUMITOMO METAL IND (2)· patent assignee history
2001–2002Based in Osaka, JP· patent location history
2005–2012Patents assigned to TOKYO ELECTRON LTD (11)· patent assignee history
2005–2011Based in Hyogo, JP· patent location history
2006Based in Tokyo, JP· patent location history
2008–2012Based in Amagasaki, JP· patent location history
2011–2012Patents assigned to IKEUCHI NAOKI (2)· patent assignee history
2012Patents assigned to FUJIWARA HISASHI (1)· patent assignee history
2012Patents assigned to HAYASHI MASATO (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOKYO ELECTRON LTD | 11 | 2005–2012 |
| IKEUCHI NAOKIself | 2 | 2011–2012 |
| SUMITOMO METAL IND | 2 | 2001–2002 |
| FUJIWARA HISASHI | 1 | 2012 |
| HAYASHI MASATO | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Amagasaki, JP | 5 | 2008–2012 |
| Tokyo, JP | 4 | 2006 |
| Hyogo, JP | 2 | 2005–2011 |
| Osaka, JP | 2 | 2001–2002 |