LexDanaLexDanabeta
Inventor

Kazunori Saitoh

Inventor
Hyogo, JP

Overview

14→
Patents
1985–2012
Patent span
Electricity
Primary field (CPC H)

Patents· 14 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

B82Yprimary
B82YSpecific uses or applications of nanostructures14%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light14%
G11CStatic stores10%
C21CProcessing of pig-iron, e.g. refining, manufacture of wrought-iron or steel7%
F27DDetails or accessories of furnaces, kilns, ovens or retorts, in so far as they are of kinds occurring in more than one kind of furnace7%
G11BInformation storage based on relative movement between record carrier and transducer7%
Y02PClimate change mitigation technologies in the production or processing of goods7%
C04BLime, magnesia3%
F23JRemoval or treatment of combustion products or combustion residues3%
G01NInvestigating or analysing materials by determining their chemical or physical properties3%
PatentTitleYear
8,089,819'Semiconductor device and semiconductor signal processing apparatus'20127,791,962'Semiconductor device and semiconductor signal processing apparatus'20107,720,127'Opto-semiconductor devices'20107,674,391'Manufacturing method of optical semiconductor device'20107,562,198'Semiconductor device and semiconductor signal processing apparatus'20097,463,662'Optical semiconductor device, manufacturing method therefor, and optical semiconductor apparatus'20087,443,901'Opto-semiconductor devices'20086,835,543'Step agglutination immunoassay'20046,631,062'Electrically conductive ceramic material, a process of producing same, and an electrostatic chuck'20036,563,774'Drive apparatus for optical recording medium capable of reducing resonance'20036,192,011'Gain controlling apparatus and method, information reproducing apparatus and method, and information recording apparatus and method'20015,379,301'Microprocessor for debugging programs'19954,611,339'Method and apparatus for removal of impure gases at time of scrap preheating'19864,492,567'Method of removal of impure gases at the time of scrap preheating, and equipment for use of same'1985

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1985–1986Patents assigned to PENNSYLVANIA ENGINEERING CORP (2)· patent assignee history
1985–1986Based in Tokyo, JP· patent location history
2001–2003Patents assigned to PIONEER CORP (2)· patent assignee history
2001–2003Patents assigned to PIONEER TOHOKU CORP (2)· patent assignee history
2001–2003Based in Tendo, JP· patent location history
2008–2010Patents assigned to OPNEXT JAPAN INC (4)· patent assignee history
2008–2010Based in Maruko, JP· patent location history
2009–2010Patents assigned to RENESAS TECH CORP (2)· patent assignee history
2009–2012Based in Hyogo, JP· patent location history
2010Based in Ueda, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
OPNEXT JAPAN INC42008–2010
PENNSYLVANIA ENGINEERING CORP21985–1986
PIONEER CORP22001–2003
PIONEER TOHOKU CORP22001–2003
RENESAS TECH CORP22009–2010
Locations
LocationPatentsSpan
Hyogo, JP32009–2012
Maruko, JP32008–2010
Tendo, JP22001–2003
Tokyo, JP21985–1986
Ueda, JP12010