Inventor

Nils Haverkamp

Inventor

Aalen, DE

Overview

27→

Patents

2011–2021

Patent span

Physics

Primary field (CPC G)

Patents· 27 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary

G01BMeasuring length, thickness or similar linear dimensions22%

G02BOptical elements, systems or apparatus12%

G06TImage data processing or generation, in general11%

G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices8%

B33YAdditive manufacturing, i.e. manufacturing of three-dimensional [3d] objects by additive deposition, additive agglomeration or additive layering, e.g. by 3d printing, stereolithography or selective laser sintering5%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%

B29CShaping or joining of plastics4%

G01NInvestigating or analysing materials by determining their chemical or physical properties4%

H04NPictorial communication, e.g. television4%

Y02PClimate change mitigation technologies in the production or processing of goods4%

PatentTitleYear

11,104,064Method and arrangement for producing a workpiece by using additive manufacturing techniques2021 11,041,799Device for 3D measurement of object coordinates2021 11,003,873Optical measuring system and method2021 10,922,836Method and system for determining a 3D position of an object in space2021 10,753,725Measuring apparatus and method for controlling the illumination for a measuring apparatus2020 10,748,300Target body, arrangement including a target body, and method for determining a position and/or an alignment of a target body2020 10,706,562Motion-measuring system of a machine and method for operating the motion-measuring system2020 10,532,513Method and arrangement for producing a workpiece by using additive manufacturing techniques2020 10,422,629Method and apparatus for determining a plurality of spatial coordinates on a measurement object2019 10,415,955Measuring system2019 10,371,500Incident-light illumination for a variable working distance2019 10,360,684Method and apparatus for edge determination of a measurement object in optical metrology2019 10,345,101Device and method for calibrating a coordinate-measuring device2019 10,220,566Method and arrangement for producing a workpiece by using additive manufacturing techniques2019 10,151,576Confocally chromatic sensor for determining coordinates of a measurement object2018 10,120,163Auto-focus method for a coordinate-measuring apparatus2018 10,088,754Illumination system for microlithography2018 10,067,028Calibration structure and calibration method for calibrating optical measuring devices2018 9,990,724Image recording simulation in a coordinate measuring machine2018 9,939,261Method and device for calibrating an imaging optical unit for metrological applications2018 9,857,164'Lens device for a variable working distance, illumination assembly, coordinate measuring machine and method'2018 9,846,026Light-emitting table suitable for use in metrology, and coordinate measuring machine having such a light-emitting table2017 9,606,441'Illumination system for microlithography'2017 9,280,060'Illumination system for microlithography'2016 8,873,023'Illumination system for microlithography'2014 8,520,307'Optical integrator for an illumination system of a microlithographic projection exposure apparatus'2013 7,880,969'Optical integrator for an illumination system of a microlithographic projection exposure apparatus'2011

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2011–2013Based in Oberkochen, DE· patent location history

2013–2018Patents assigned to ZEISS CARL SMT GMBH (5)· patent assignee history

2013–2014Patents assigned to GERHARD MICHAEL (2)· patent assignee history

2013–2014Patents assigned to HAVERKAMP NILS (2)· patent assignee history

2014–2021Based in Aalen, DE· patent location history

2017–2021Patents assigned to ZEISS CARL INDUSTRIELLE MESSTECHNIK GMBH (21)· patent assignee history

2019–2021Patents assigned to CARL ZEISS IND METROLOGY LLC (3)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
ZEISS CARL INDUSTRIELLE MESSTECHNIK GMBH	21	2017–2021
ZEISS CARL SMT GMBH	5	2013–2018
CARL ZEISS IND METROLOGY LLC	3	2019–2021
GERHARD MICHAEL	2	2013–2014
HAVERKAMP NILSself	2	2013–2014

Locations

Location	Patents	Span
Aalen, DE	25	2014–2021
Oberkochen, DE	2	2011–2013