Inventor
Dmitry Bakin
Inventor
San Jose, CA, US
Overview
Patents· 24 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus25%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
H01LSemiconductor devices7%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light7%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation7%
B24BMachines, devices, or processes for grinding or polishing5%
G01BMeasuring length, thickness or similar linear dimensions5%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light5%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them5%
H04QSelecting5%
PatentTitleYear
10,761,244Illumination assembly for 3D data acquisition202010,761,192Illumination modules for translating light202010,566,363Light emitter and light detector modules including vertical alignment features202010,466,501Optoelectronic modules including an optical system tilted with respect to a focal plane201910,019,112Touch panels with dynamic zooming and low profile bezels201810,001,583Structured light projection using a compound patterned mask20189,768,361'Light emitter and light detector modules including vertical alignment features'20178,779,483'Spectrally tuned plasmonic light collectors'20148,538,120'System for targeting cells or other materials'20137,991,240'Methods, systems and apparatuses for modeling optical images'20117,924,483'Fused multi-array color image sensor'20117,215,479'Integrated lens system for image sensor and method for manufacturing the same'20077,076,146'Variable optical attenuator'20067,042,581'Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers'20067,027,232'Optical cross-connect switch with telecentric lens and multi-surface optical element'20066,985,299'Optical cross-connect switch with telecentric lens and multi-surface optical element'20066,980,712'Optical system for calibration and control of an optical fiber switch'20056,934,040'Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers'20056,922,500'Optical configuration for optical fiber switch'20056,898,341'Optical system for calibration and control of an optical fiber switch'20056,754,431'Variable optical attenuator'20046,654,132'Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers'20036,636,656'System architecture of optical switching fabric'20036,222,632'Polarization interferometer spectrometer with rotatable birefringent element'2001Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2001–2006Patents assigned to LUXTRON CORP (4)· patent assignee history
2001–2020Based in San Jose, CA, US· patent location history
2004–2006Patents assigned to INTEL CORP (7)· patent assignee history
2011–2014Patents assigned to APTINA IMAGING CORP (3)· patent assignee history
2011–2014Patents assigned to BAKIN DMITRY (3)· patent assignee history
2019–2020Patents assigned to AMS SENSORS SINGAPORE PTE LTD (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| INTEL CORP | 7 | 2004–2006 |
| LUXTRON CORP | 4 | 2001–2006 |
| AMS SENSORS SINGAPORE PTE LTD | 3 | 2019–2020 |
| APTINA IMAGING CORP | 3 | 2011–2014 |
| BAKIN DMITRYself | 3 | 2011–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| San Jose, California, US | 24 | 2001–2020 |