Inventor
Masahiro Sakuta
Inventor
Tokyo, JP
Overview
Patents· 7 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties41%
H01JElectric discharge tubes or discharge lamps24%
G01BMeasuring length, thickness or similar linear dimensions12%
G01DMeasuring not specially adapted for a specific variable6%
G01TMeasurement of nuclear or x-radiation6%
G06FElectric digital data processing6%
Y02BClimate change mitigation technologies related to buildings, e.g. housing, house appliances or related end-user applications6%
PatentTitleYear
10,989,642Apparatus for and method of mass analysis202110,847,355Mass analysis apparatus and method202010,651,018Apparatus for and method of mass analysis202010,636,638Mass analysis apparatus and method20209,784,700'X-ray analyzer'20179,719,949'X-ray flourescent analyzer'20179,188,553'X-ray fluorescence analyzer'2015Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2015–2021Patents assigned to HITACHI HIGH TECH SCIENCE CORP (5)· patent assignee history
2015–2021Based in Tokyo, JP· patent location history
2017Patents assigned to HITACHI HIGH-TECH SCIENCE CORP (2)· patent assignee history
2020Patents assigned to HITATCHI HIGH TECH SCIENCE CORP (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH SCIENCE CORP | 5 | 2015–2021 |
| HITACHI HIGH-TECH SCIENCE CORP | 2 | 2017 |
| HITATCHI HIGH TECH SCIENCE CORP | 1 | 2020 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 7 | 2015–2021 |