Inventor
Akihiro Ikeshita
Inventor
Takatsuki, JP
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties67%
G01BMeasuring length, thickness or similar linear dimensions17%
G21KHandling of particles or ionising radiation not otherwise provided for17%
PatentTitleYear
10,598,616X-ray reflectometer20209,146,204'X-ray analyzing apparatus and method'20156,937,691'X-ray fluorescence spectrometric system and a program for use therein'20056,735,276'Sample preprocessing system for a fluorescent X-ray analysis and X-ray fluorescence spectrometric system using the same'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2005Patents assigned to RIGAKU IND CORP (2)· patent assignee history
2004–2020Based in Takatsuki, JP· patent location history
2015–2020Patents assigned to RIGAKU DENKI CO LTD (2)· patent assignee history
2015Patents assigned to FUKUDA TOMOYUKI (1)· patent assignee history
2015Patents assigned to IKESHITA AKIHIRO (1)· patent assignee history
2015Patents assigned to SHIMIZU KOSUKE (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| RIGAKU DENKI CO LTD | 2 | 2015–2020 |
| RIGAKU IND CORP | 2 | 2004–2005 |
| FUKUDA TOMOYUKI | 1 | 2015 |
| IKESHITA AKIHIROself | 1 | 2015 |
| SHIMIZU KOSUKE | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Takatsuki, JP | 4 | 2004–2020 |