Inventor
Mizuho Tomiyama
Inventor
Tokyo, JP
Overview
Patents· 8 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus19%
G03BApparatus or arrangements for taking photographs or for projecting or viewing them19%
H01LSemiconductor devices10%
H04NPictorial communication, e.g. television10%
H10HInorganic light-emitting semiconductor devices having potential barriers10%
F17DPipe-line systems6%
F21VFunctional features or details of lighting devices or systems thereof6%
G01MTesting static or dynamic balance of machines or structures6%
G01NInvestigating or analysing materials by determining their chemical or physical properties6%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein6%
PatentTitleYear
9,804,053'Defect analysis device, defect analysis method, and program'20179,759,629'Leak detection device, leak detection method and program'20179,304,384'Projection display apparatus and projection light generating method'20169,195,125'Projection display apparatus and projection light generating method'20159,170,351'Optical element, light source apparatus, and projection-type display apparatus'20159,103,527'Light source unit and projection display device with the same'20159,041,041'Optical device, optical element, and image display device'20159,028,070'Light emitting element having structural bodies arrayed at a first pitch along a first direction and arrayed at a second pitch different from said first pitch along a second direction and projection display device provided with same'2015Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2015–2017Patents assigned to NEC CORP (8)· patent assignee history
2015Patents assigned to TOMIYAMA MIZUHO (3)· patent assignee history
2015Patents assigned to IMAI MASAO (1)· patent assignee history
2015Patents assigned to KATAYAMA RYUICHI (1)· patent assignee history
2015Patents assigned to NATSUMEDA MASANAO (1)· patent assignee history
2015–2017Based in Tokyo, JP· patent location history
2015Based in Minato-ku, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NEC CORP | 8 | 2015–2017 |
| TOMIYAMA MIZUHOself | 3 | 2015 |
| IMAI MASAO | 1 | 2015 |
| KATAYAMA RYUICHI | 1 | 2015 |
| NATSUMEDA MASANAO | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 7 | 2015–2017 |
| Minato-ku, JP | 1 | 2015 |