Inventor
Pavel Potocek
Inventor
NL
Overview
Patents· 16 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps30%
G06TImage data processing or generation, in general24%
G01NInvestigating or analysing materials by determining their chemical or physical properties15%
G06NComputing arrangements based on specific computational models13%
G06VImage or video recognition or understanding11%
G06FElectric digital data processing4%
H04LTransmission of digital information, e.g. telegraphic communication2%
PatentTitleYear
12,548,732Application management for charged particle microscope devices202612,392,735Sparse image reconstruction from neighboring tomography tilt images202512,288,667Live-assisted image acquisition method and system with charged particle microscopy202512,223,752Data acquisition in charged particle microscopy202512,175,648Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method202412,136,532Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging202412,085,523Adaptive specimen image acquisition using an artificial neural network202412,002,194Training an artificial neural network using simulated specimen images202411,982,634Adaptive specimen image acquisition202411,861,817Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method202411,741,730Charged particle microscope scan masking for three-dimensional reconstruction202311,488,800Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging202211,482,400Method, device and system for remote deep learning for microscopic image reconstruction and segmentation202211,380,529Depth reconstruction for 3D images of samples in a charged particle system202211,355,305Low keV ion beam image restoration by machine learning for object localization202211,282,670Slice depth reconstruction of charged particle images using model simulation for improved generation of 3D sample images2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2026Patents assigned to FEI CO (16)· patent assignee history
2022–2026Based in NL· patent location history
2025Based in CZ· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| FEI CO | 16 | 2022–2026 |
Locations
| Location | Patents | Span |
|---|---|---|
| NL | 15 | 2022–2026 |
| CZ | 1 | 2025 |