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Inventor

Michael D. Bienek

Inventor
Austin, TX, US

Overview

6→
Patents
2002–2017
Patent span
Physics
Primary field (CPC G)

Patents· 6 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables30%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1020%
G01KMeasuring temperature10%
G06FElectric digital data processing10%
G11CStatic stores10%
H01LSemiconductor devices10%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1010%
PatentTitleYear
9,627,281'Semiconductor chip with thermal interface tape'20177,991,955'Method and apparatus to achieve more level thermal gradient'20117,650,550'Over temperature detection apparatus and method thereof'20107,180,380'Zoned thermal monitoring'20076,867,613'Built-in self timing test method and apparatus'20056,407,613'Multipurpose test chip input/output circuit'2002

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2002Based in Wylie, TX, US· patent location history
2005–2017Patents assigned to ADVANCED MICRO DEVICES INC (4)· patent assignee history
2005–2017Based in Austin, TX, US· patent location history
2017Patents assigned to ATI TECHNOLOGIES ULC (1)· patent assignee history
2017Patents assigned to BIENEK MICHAEL (1)· patent assignee history
2017Patents assigned to BLACK BRYAN (1)· patent assignee history
2017Patents assigned to BRANDON RONNIE (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
ADVANCED MICRO DEVICES INC42005–2017
ATI TECHNOLOGIES ULC12017
BIENEK MICHAELself12017
BLACK BRYAN12017
BRANDON RONNIE12017
Locations
LocationPatentsSpan
Austin, Texas, US52005–2017
Wylie, Texas, US12002