Inventor
Matthias Zieger
Inventor
Riesa, DE
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables100%
PatentTitleYear
9,983,232Prober for testing devices in a repeat structure on a substrate20188,841,932'Prober for testing devices in a repeat structure on a substrate'20147,932,737'Prober for testing devices in a repeat structure on a substrate'20117,046,025'Test apparatus for testing substrates at low temperatures'2006Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2006Patents assigned to SUSS MICROTEC TESTSYSTEMS GMBH (1)· patent assignee history
2006–2018Based in Riesa, DE· patent location history
2011–2018Patents assigned to CASCADE MICROTECH INC (3)· patent assignee history
2014Patents assigned to GIESSMANN SEBASTIAN (1)· patent assignee history
2014Patents assigned to WERNER FRANK-MICHAEL (1)· patent assignee history
2014Patents assigned to ZIEGER MATTHIAS (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| CASCADE MICROTECH INC | 3 | 2011–2018 |
| GIESSMANN SEBASTIAN | 1 | 2014 |
| SUSS MICROTEC TESTSYSTEMS GMBH | 1 | 2006 |
| WERNER FRANK-MICHAEL | 1 | 2014 |
| ZIEGER MATTHIASself | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Riesa, DE | 4 | 2006–2018 |