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Inventor

Toru Mitsunaga

Inventor
Hachioji, JP

Overview

8→
Patents
2008–2020
Patent span
Physics
Primary field (CPC G)

Patents· 8 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties54%
G21KHandling of particles or ionising radiation not otherwise provided for15%
G01BMeasuring length, thickness or similar linear dimensions8%
G01TMeasurement of nuclear or x-radiation8%
G06FElectric digital data processing8%
LOC248%
PatentTitleYear
10,876,979Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffraction202010,837,923X-ray analysis device and method for optical axis alignment thereof202010,732,134X-ray diffraction apparatus202010,444,168Method and apparatus for measuring bowing of single-crystal substrate20199,322,792'X-ray diffraction apparatus and method of measuring X-ray diffraction'20169,218,315'X-ray analysis apparatus'20159,086,367'X-ray intensity correction method and X-ray diffractometer'2015D0566278'X-ray analysis device'2008

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2008–2020Patents assigned to RIGAKU DENKI CO LTD (8)· patent assignee history
2008–2020Based in Tokyo, JP· patent location history
2015–2020Based in Hachioji, JP· patent location history
2016Based in Akishima, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
RIGAKU DENKI CO LTD82008–2020
Locations
LocationPatentsSpan
Hachioji, JP42015–2020
Tokyo, JP32008–2020
Akishima, JP12016