Inventor
Romain Desplats
Inventor
Toulouse, FR
Overview
Patents· 23 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables47%
H01JElectric discharge tubes or discharge lamps8%
G06FElectric digital data processing5%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h105%
A63FCard, board, or roulette games3%
B23KSoldering or unsoldering3%
F03DWind motors3%
F05BIndexing scheme relating to wind, spring, weight, inertia or like motors, to machines or engines for liquids covered by subclasses f03b, f03d and f03g3%
G01NInvestigating or analysing materials by determining their chemical or physical properties3%
G02BOptical elements, systems or apparatus3%
PatentTitleYear
10,388,148Method of controlling a calculation device via a mobile element and control system implementing this method20198,555,728'Method and installation for exposing the surface of an integrated circuit'20138,344,538'Wind-powered device for producing electrical energy'20138,326,558'Method of analyzing an integrated circuit, method of observation and their associated installations'20127,692,151'Device for analyzing an integrated circuit'20107,560,940'Method and installation for analyzing an integrated circuit'20097,439,730'Apparatus and method for detecting photon emissions from transistors'20087,417,424'Magnetic-field-measuring device'20087,411,391'Magnetic-field-measuring probe'20087,408,342'Device for measuring a component of current based on magnetic fields'20087,400,154'Apparatus and method for detecting photon emissions from transistors'20087,323,862'Apparatus and method for detecting photon emissions from transistors'20087,190,822'Method for customizing an integrated circuit element'20077,038,442'Apparatus and method for detecting photon emissions from transistors'20066,970,759'Method and device for automatic optimal location of an operation on an integrated circuit'20056,967,491'Spatial and temporal selective laser assisted fault localization'20056,948,107'Method and installation for fast fault localization in an integrated circuit'20056,943,572'Apparatus and method for detecting photon emissions from transistors'20056,891,363'Apparatus and method for detecting photon emissions from transistors'20056,844,625'Method for producing input/output permutation of several conductive strips with parallel branches of an integrated circuit and resulting circuit'20056,816,614'Method for comparing recorded pixel images representing equipotential lines of at least an integrated circuit chip'20046,552,341'Installation and method for microscopic observation of a semiconductor electronic circuit'20036,526,546'Method for locating faulty elements in an integrated circuit'2003Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2003–2019Patents assigned to CENTRE NAT ETD SPATIALES (16)· patent assignee history
2003–2008Based in Toulouse, FR· patent location history
2005–2008Patents assigned to CREDENCE SYSTEMS CORP (6)· patent assignee history
2008Patents assigned to DCG SYSTEMS INC (1)· patent assignee history
2009–2019Based in Castanet Tolosan, FR· patent location history
2012–2013Patents assigned to DESPLATS ROMAIN (3)· patent assignee history
2019Patents assigned to CENTRE NAT DEDUTES SPATIALES (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| CENTRE NAT ETD SPATIALES | 16 | 2003–2019 |
| CREDENCE SYSTEMS CORP | 6 | 2005–2008 |
| DESPLATS ROMAINself | 3 | 2012–2013 |
| CENTRE NAT DEDUTES SPATIALES | 1 | 2019 |
| DCG SYSTEMS INC | 1 | 2008 |
Locations
| Location | Patents | Span |
|---|---|---|
| Toulouse, FR | 17 | 2003–2008 |
| Castanet Tolosan, FR | 6 | 2009–2019 |