Inventor
Xuedong Liu
Inventor
San Jose, CA, US
Overview
Patents· 51 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps41%
A61KPreparations for medical, dental or toiletry purposes10%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
A61PSpecific therapeutic activity of chemical compounds or medicinal preparations6%
A61QSpecific use of cosmetics or similar toiletry preparations5%
C07KPeptides5%
C07DHeterocyclic compounds3%
C12NMicroorganisms or enzymes2%
G06FElectric digital data processing2%
H04LTransmission of digital information, e.g. telegraphic communication2%
PatentTitleYear
D0920269Television202110,879,032Multi-beam inspection apparatus202010,879,031Apparatus of plural charged-particle beams202010,811,222Apparatus of plural charged-particle beams202010,643,820Apparatus of plural charged-particle beams202010,624,604Medical diagnostic high-frequency X-ray machines and power supply devices thereof202010,573,487Apparatus of plural charged-particle beams202010,541,110Apparatus of plural charged-particle beams202010,508,122Heterocyclic hydroxamic acids as protein deacetylase inhibitors and dual protein deacetylase-protein kinase inhibitors and methods of use thereof2019RE047690Heterocyclic hydroxamic acids as protein deacetylase inhibitors and dual protein deacetylase-protein kinase inhibitors and methods of use thereof201910,395,886Apparatus of plural charged-particle beams201910,276,347Apparatus of plural charged-particle beams201910,236,156Apparatus of plural charged-particle beams201910,141,160Apparatus of plural charged-particle beams201810,115,559Apparatus of plural charged-particle beams201810,109,456Apparatus of plural charged-particle beams201810,062,541Apparatus of plural charged-particle beams20189,984,022Method and apparatus to identify a communication protocol being used in a process control system20189,922,799'Apparatus of plural charged-particle beams'20189,840,520'Heterocyclic hydroxamic acids as protein deacetylase inhibitors and dual protein deacetylase-protein kinase inhibitors and methods of use thereof'20179,707,161'Color-changing composition'20179,691,588'Apparatus of plural charged-particle beams'20179,691,586'Apparatus of plural charged-particle beams'20179,675,533'Colour changing composition in gel form'20179,668,949'Colour changing composition in O/W emulsion form'20179,662,283'Colour changing composition'20179,607,805'Apparatus of plural charged-particle beams'20179,431,209'Apparatus of plural charged particle beams with multi-axis magnetic lenses'20169,430,429'Methods and apparatus to identify a communication protocol being used in a process control system'20169,422,340'Macrocyclic compounds useful as inhibitors of histone deacetylases'20169,202,658'Multi-axis magnetic lens for focusing a plurality of charged particle beams'20159,105,440'Apparatus of plural charged particle beams with multi-axis magnetic lens'20159,086,442'Methods and apparatus to detect leakage current in a resistance temperature detector'20158,835,867'Multi-axis magnetic lens for focusing a plurality of charged particle beams'20148,754,050'Macrocyclic compounds useful as inhibitors of histone deacetylases'20148,624,186'Movable detector for charged particle beam inspection or review'20148,618,480'Charged particle beam apparatus'20138,445,862'Apparatus of plural charged particle beams with multi-axis magnetic lens'20138,436,317'Wien filter'20138,421,029'Wien filter with reduced field leakage'20138,294,095'Apparatus of plural charged particle beams with multi-axis magnetic lens'20128,164,060'System and method for a charged particle beam'20128,094,924'E-beam defect review system'20128,003,953'Multi-axis magnetic lens'20117,960,697'Electron beam apparatus'20117,825,386'System and method for a charged particle beam'20107,759,653'Electron beam apparatus'20107,705,301'Electron beam apparatus to collect side-view and/or plane-view image with in-lens sectional detector'20107,705,298'System and method to determine focus parameters during an electron beam inspection'20105,914,267'Pre-mRNA processing enhancer and method for intron-independent gene expression'19995,686,120'Pre-mRNA processing enhancer and method for intron-independent gene expression'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2010–2020Patents assigned to HERMES MICROVISION INC (27)· patent assignee history
2010–2013Based in Cupertino, CA, US· patent location history
2012–2014Patents assigned to LIU XUEDONG (8)· patent assignee history
2012–2014Patents assigned to CHEN ZHONGWEI (7)· patent assignee history
2012–2013Patents assigned to REN WEIMING (5)· patent assignee history
2013–2020Based in San Jose, CA, US· patent location history
2014–2019Based in Niwot, CO, US· patent location history
2015–2018Based in Avon, CT, US· patent location history
2017Based in Shanghai, CN· patent location history
2019–2020Patents assigned to ASML NETHERLANDS BV (7)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HERMES MICROVISION INC | 27 | 2010–2020 |
| LIU XUEDONGself | 8 | 2012–2014 |
| ASML NETHERLANDS BV | 7 | 2019–2020 |
| CHEN ZHONGWEI | 7 | 2012–2014 |
| REN WEIMING | 5 | 2012–2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| San Jose, California, US | 25 | 2013–2020 |
| Cupertino, California, US | 9 | 2010–2013 |
| Niwot, CO, US | 5 | 2014–2019 |
| Shanghai, CN | 4 | 2017 |
| Avon, CT, US | 3 | 2015–2018 |