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Inventor

Tetsuya Yamaguchi

Inventor
Yokohama, JP

Overview

60→
Patents
1994–2017
Patent span
Electricity
Primary field (CPC H)

Patents· 60 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Fprimary
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation25%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests9%
F16HGearing7%
F04CRotary-piston, or oscillating-piston, positive-displacement machines for liquids5%
G03GElectrography5%
H04NPictorial communication, e.g. television4%
B60KArrangement or mounting of propulsion units or of transmissions in vehicles3%
F16DCouplings for transmitting rotation3%
G01MTesting static or dynamic balance of machines or structures3%
H01JElectric discharge tubes or discharge lamps3%
PatentTitleYear
9,551,626'Leak testing method'20179,404,828'Leak test method and leak test apparatus'20169,140,312'Hydraulic control device for hybrid drive device'20158,916,917'Solid-state imaging device'20148,878,265'Solid-state imaging device'20148,851,254'Power transmission device'20148,845,484'Vehicle drive device'20148,643,131'Solid-state imaging device and method of manufacturing the same'20148,506,037'Image forming apparatus'20138,508,628'Solid-state image sensing device and method of manufacturing the same'20138,479,556'I-beam wear assessment trolleys and methods for using the same'20138,334,916'Solid-state image sensor with reduced signal noise'20128,219,004'Image forming apparatus'20127,962,067'Image forming apparatus having phase control of photoconductor groups'20117,889,255'Solid-state imaging device comprising a signal storage section including a highly doped area'20117,855,406'Solid-state imaging device and method of manufacturing the same'20107,823,114'Method of designing wiring structure of semiconductor device and wiring structure designed accordingly'20107,809,309'Photosensitive-member driving mechanism'20107,711,285'Cleaning device for an image forming apparatus'20107,709,870'CMOS (complementary metal oxide semiconductor) type solid-state image pickup device using N/P+ substrate in which N-type semiconductor layer is laminated on P+ type substrate main body'20107,706,705'Image forming apparatus and correction method of image forming condition'20107,705,380'Amplification-type solid-state image sensing device'20107,628,729'Hydraulic control apparatus for an automatic transmission'20097,621,837'Hydraulic control apparatus for an automatic transmission'20097,618,344'Hydraulic control apparatus for a multi-stage automatic transmission'20097,554,141'Solid-state image pickup device and method of manufacturing the same'20097,373,627'Method of designing wiring structure of semiconductor device and wiring structure designed accordingly'20087,259,412'Solid state imaging device'20077,224,003'Solid-state image pickup apparatus'20077,166,828'Solid-state image sensing device and cellphone having image processing function'20077,042,061'Solid-state image pickup apparatus'20067,027,805'Mobile communication terminal'20066,978,434'Method of designing wiring structure of semiconductor device and wiring structure designed accordingly'20056,943,389'Solid-state imaging device'20056,809,951'Ferroelectric semiconductor memory'20046,757,873'Simulator of semiconductor device circuit characteristic and simulation method'20046,728,937'Circuit simulation device for predicting the dispersion of circuit characteristics and the electric characteristics'20046,690,423'Solid-state image pickup apparatus'20046,674,470'MOS-type solid state imaging device with high sensitivity'20046,521,925'Solid-state image sensor'20036,441,411'Solid-state image sensor having a substrate with an impurity concentration gradient'20026,344,666'Amplifier-type solid-state image sensor device'20026,344,670'Solid-state sensor and system'20026,271,554'Solid-state image sensor having a substrate with an impurity concentration gradient'20016,211,509'Solid-state image sensor'20016,194,244'Method of manufacturing a photodiode in a solid-state device'20016,105,698'Structure for maintaining passenger space in cab'20006,077,049'Double-headed piston type compressor'20006,072,206'Solid state image sensor'2000RE036429'Alternating electric field diminishing structure for cathode ray tube device'19995,947,698'Piston type compressor'19995,807,089'Scroll type compressor with a reinforced rotation preventing means'19985,547,354'Scroll compressor balancing'19965,547,353'Scroll type compressor with elliptical spiral element'19965,527,417'Photo-assisted CVD apparatus'19965,470,213'Scroll type compressor having a ring for compressive force transmission and orbit determination'19955,451,840'Cathode-ray tube providing protection from alternating electric fields'19955,430,352'Alternating electric field diminishing structure for cathode ray tube device'19955,366,357'Scroll type compressor having a counterweight mounted with a clearance on a driveshaft'19945,362,218'Scroll type compressor with counterweight'1994

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1994–2000Patents assigned to TOYODA AUTOMATIC LOOM WORKS (8)· patent assignee history
1994–2000Based in Kariya, JP· patent location history
1996–2014Patents assigned to TOSHIBA KK (30)· patent assignee history
1996–2014Based in Yokohama, JP· patent location history
2005–2012Based in Tokyo, JP· patent location history
2009–2017Patents assigned to TOYOTA MOTOR CO LTD (8)· patent assignee history
2009–2015Patents assigned to AISIN AW CO (6)· patent assignee history
2009–2015Based in Anjo, JP· patent location history
2010–2013Based in Nara, JP· patent location history
2012–2016Patents assigned to YAMAGUCHI TETSUYA (11)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TOSHIBA KK301996–2014
YAMAGUCHI TETSUYAself112012–2016
TOYODA AUTOMATIC LOOM WORKS81994–2000
TOYOTA MOTOR CO LTD82009–2017
AISIN AW CO62009–2015
Locations
LocationPatentsSpan
Yokohama, JP201996–2014
Tokyo, JP92005–2012
Kariya, JP81994–2000
Anjo, JP62009–2015
Nara, JP42010–2013