Inventor
William L. Guthrie
Inventor
Saratoga, CA, US
Overview
Patents· 25 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
B24Bprimary
B24BMachines, devices, or processes for grinding or polishing23%
G01BMeasuring length, thickness or similar linear dimensions16%
B24DTools for grinding, buffing or sharpening12%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
G06FElectric digital data processing9%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h107%
C09GPolishing compositions4%
G11BInformation storage based on relative movement between record carrier and transducer4%
H05KPrinted circuits4%
B24CAbrasive or related blasting with particulate material2%
PatentTitleYear
10,101,918Systems and methods for generating hint information associated with a host command20189,824,007'Data integrity enhancement to protect against returning old versions of data'20179,817,752'Data integrity enhancement to protect against returning old versions of data'20178,949,491'Buffer memory reservation techniques for use with a NAND flash memory'20158,364,992'Method and system for reducing power consumption by command selection in a hard disk drive'20137,255,629'Polishing assembly with a window'20077,118,450'Polishing pad with window and method of fabricating a window in a polishing pad'20067,011,565'Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus'20066,910,944'Method of forming a transparent window in a polishing pad'20056,632,377'Chemical-mechanical planarization of metallurgy'20036,280,290'Method of forming a transparent window in a polishing pad'20016,280,297'Apparatus and method for distribution of slurry in a chemical mechanical polishing system'20016,131,271'Method of planarizing first pole piece layer of write head by lapping without delamination of first pole piece layer from wafer substrate'20006,051,499'Apparatus and method for distribution of slurry in a chemical mechanical polishing system'20006,045,439'Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus'20006,020,264'Method and apparatus for in-line oxide thickness determination in chemical-mechanical polishing'20005,893,796'Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus'19995,795,215'Method and apparatus for using a retaining ring to control the edge effect'19985,709,593'Apparatus and method for distribution of slurry in a chemical mechanical polishing system'19985,633,195'Laser planarization of zone 1 deposited metal films for submicron metal interconnects'19975,337,015'In-situ endpoint detection method and apparatus for chemical-mechanical polishing using low amplitude input voltage'19944,954,142'Method of chemical-mechanical polishing an electronic component substrate and polishing slurry therefor'19904,944,836'Chem-mech polishing method for producing coplanar metal/insulator films on a substrate'19904,789,648'Method for producing coplanar multi-level metal/insulator films on a substrate and for forming patterned conductive lines simultaneously with stud vias'19884,702,792'Method of forming fine conductive lines, patterns and connectors'1987Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1987–2003Patents assigned to IBM (9)· patent assignee history
1987–1997Based in Hopewell Junction, NY, US· patent location history
1990Based in Poughkeepsie, NY, US· patent location history
1998–2007Patents assigned to APPLIED MATERIALS INC (11)· patent assignee history
1998–2007Based in Saratoga, CA, US· patent location history
2013Patents assigned to GUTHRIE WILLIAM (1)· patent assignee history
2013Based in San Jose, CA, US· patent location history
2015–2018Patents assigned to SANDISK TECHNOLOGIES INC (2)· patent assignee history
2015–2018Based in Santa Cruz, CA, US· patent location history
2017–2018Patents assigned to SANDISK TECHNOLOGIES LLC (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| APPLIED MATERIALS INC | 11 | 1998–2007 |
| IBM | 9 | 1987–2003 |
| SANDISK TECHNOLOGIES LLC | 3 | 2017–2018 |
| SANDISK TECHNOLOGIES INC | 2 | 2015–2018 |
| GUTHRIE WILLIAMself | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Saratoga, California, US | 14 | 1998–2007 |
| Hopewell Junction, New York, US | 5 | 1987–1997 |
| Santa Cruz, California, US | 4 | 2015–2018 |
| San Jose, California, US | 1 | 2013 |
| Poughkeepsie, New York, US | 1 | 1990 |