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Inventor

Hiroshi Ohga

Inventor
Hitachiomiya, JP

Overview

19→
Patents
2009–2020
Patent span
Physics
Primary field (CPC G)

Patents· 19 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties53%
B01LChemical or physical laboratory apparatus for general use13%
Y10TTechnical subjects covered by former us classification9%
LOC246%
B65CLabelling or tagging machines, apparatus, or processes3%
B65DContainers for storage or transport of articles or materials, e.g. bags, barrels, bottles, boxes, cans, cartons, crates, drums, jars, tanks, hoppers, forwarding containers3%
B65GTransport or storage devices, e.g. conveyors for loading or tipping, shop conveyor systems or pneumatic tube conveyors3%
G05BControl or regulating systems in general3%
G06FElectric digital data processing3%
G08BSignalling systems, e.g. personal calling systems3%
PatentTitleYear
10,816,564Sample test automation system202010,094,748Specimen transfer device and system20189,776,185'Reagent container and automatic analysis apparatus'20179,753,048'Sample test automation system'20179,636,681'Holder for transferring test tube'20179,483,048'Sample transport system and method for controlling the same'20169,476,806'Sample processing system'20169,470,608'Sample processing system'20169,390,597'Laboratory automation apparatus, automated analytical apparatus and system'20169,291,633'Automated sample processing system'20169,211,543'Holder for transferring test tube'20158,972,044'Automated sample test system, and method for controlling same'20158,877,128'Automated sample testing system'20148,833,186'Sample conveying system'20148,231,843'Automatic analyzer'2012D0637312'Portion of a holder for test tube'2011D0637311'Holder for test tube'20117,727,469'Automatic analyzer'20107,547,414'Automatic analyzer'2009

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2009–2020Patents assigned to HITACHI HIGH TECH CORP (19)· patent assignee history
2009–2010Based in Ohmiya, JP· patent location history
2011–2020Based in Hitachiomiya, JP· patent location history
2012–2017Patents assigned to OHGA HIROSHI (9)· patent assignee history
2012Based in Hitachiohmiya, JP· patent location history
2014–2017Patents assigned to FUKUGAKI TATSUYA (6)· patent assignee history
2014–2017Patents assigned to HANAWA MASAAKI (3)· patent assignee history
2015–2017Patents assigned to TAKAHASHI KENICHI (3)· patent assignee history
2015–2018Based in Tokyo, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI HIGH TECH CORP192009–2020
OHGA HIROSHIself92012–2017
FUKUGAKI TATSUYA62014–2017
HANAWA MASAAKI32014–2017
TAKAHASHI KENICHI32015–2017
Locations
LocationPatentsSpan
Hitachiomiya, JP112011–2020
Tokyo, JP52015–2018
Ohmiya, JP22009–2010
Hitachiohmiya, JP12012