Inventor
Hans-Dieter Oberle
Inventor
Puchheim, DE
Overview
Patents· 11 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores50%
G01RMeasuring electric variables29%
G06FElectric digital data processing7%
H03KPulse technique7%
H04LTransmission of digital information, e.g. telegraphic communication7%
PatentTitleYear
7,487,060'Apparatus and method for tolerance analysis for digital and/or digitized measure values'20097,453,282'Input and output circuit of an integrated circuit and a method for testing the same'20087,254,502'Method and device for detecting period length fluctuations of periodic signals'20076,944,810'Method and apparatus for the testing of input/output drivers of a circuit'2005RE036061'Integrated semiconductor memory'19995,497,350'Integrated semiconductor memory device capable of switching from a memory mode to an internal test mode'19965,293,386'Integrated semiconductor memory with parallel test capability and redundancy method'19945,253,209'Integrated semiconductor memory'19934,956,819'Circuit configuration and a method of testing storage cells'19904,922,134'Testable redundancy decoder of an integrated semiconductor memory'19904,885,748'Method and circuit configuration of the parallel input of data into a semiconductor memory'1989Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1989–1999Patents assigned to SIEMENS AG (7)· patent assignee history
1989–2009Based in Puchheim, DE· patent location history
2005–2009Patents assigned to INFINEON TECHNOLOGIES AG (4)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SIEMENS AG | 7 | 1989–1999 |
| INFINEON TECHNOLOGIES AG | 4 | 2005–2009 |
Locations
| Location | Patents | Span |
|---|---|---|
| Puchheim, DE | 11 | 1989–2009 |