Inventor
Yan Hu
Inventor
Ventura, CA, US
Overview
Patents· 28 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Qprimary
G01QScanning-probe techniques or apparatus25%
B82YSpecific uses or applications of nanostructures17%
H01LSemiconductor devices10%
H04LTransmission of digital information, e.g. telegraphic communication8%
H10DInorganic electric semiconductor devices8%
G01BMeasuring length, thickness or similar linear dimensions5%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%
H01RElectrically-conductive connections3%
H10KOrganic electric solid-state devices3%
A61FFilters implantable into blood vessels2%
PatentTitleYear
11,011,437Method and apparatus for determining width-to-length ratio of channel region of thin film transistor202110,930,786Thin film transistor, manufacturing method, array substrate, display panel, and device202110,923,347Metal oxide film and manufacturing method thereof, thin film transistor and array substrate202110,916,615Display device, display panel and manufacturing method thereof202110,886,410Thin film transistor, display substrate, method for manufacturing the same, and display device202110,663,483Method and apparatus of using peak force tapping mode to measure physical properties of a sample202010,605,596Method and apparatus for measuring a size of a crystal grain, and method for fabricating a poly-silicon thin film202010,502,761Method and apparatus of operating a scanning probe microscope201910,389,710Method and system for extracting characteristic information201910,197,596Method and apparatus of operating a scanning probe microscope201910,155,528Child stroller apparatus20189,995,765Method and apparatus of using peak force tapping mode to measure physical properties of a sample20189,869,694'Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode'20189,810,713'Method and apparatus of operating a scanning probe microscope'20179,588,136'Method and apparatus of operating a scanning probe microscope'20179,433,709'Interventional medical device and manufacturing method thereof'20169,322,842'Method and apparatus of operating a scanning probe microscope'20169,291,640'Method and apparatus of using peak force tapping mode to measure physical properties of a sample'20169,274,139'Method and apparatus of operating a scanning probe microscope'20169,213,047'Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode'20159,172,641'Server interconnection system, server, and data forwarding method'20159,160,701'Addressing method, addressing apparatus, fabric manager, switch, and data routing method'20158,928,365'Methods and devices for matching transmission line characteristics using stacked metal oxide semiconductor (MOS) transistors'20158,767,841'System and method for de-modulating a high-supply-domain differential signal and a common-mode clock in a front-end receiver'20148,739,309'Method and apparatus of operating a scanning probe microscope'20148,650,660'Method and apparatus of using peak force tapping mode to measure physical properties of a sample'20148,646,109'Method and apparatus of operating a scanning probe microscope'20148,483,089'Server, method and system for providing node information for P2P network'2013Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2013–2016Patents assigned to HU YAN (6)· patent assignee history
2013–2021Based in Beijing, CN· patent location history
2014–2020Patents assigned to BRUKER NANO INC (14)· patent assignee history
2014Patents assigned to HU SHUIQING (3)· patent assignee history
2014–2020Based in Ventura, CA, US· patent location history
2014–2015Based in San Diego, CA, US· patent location history
2016–2019Based in Shanghai, CN· patent location history
2018Based in Tuen Mun, HK· patent location history
2020–2021Patents assigned to BOE TECHNOLOGY GROUP CO LTD (6)· patent assignee history
2021Patents assigned to HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO LTD (5)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| BRUKER NANO INC | 14 | 2014–2020 |
| BOE TECHNOLOGY GROUP CO LTD | 6 | 2020–2021 |
| HU YANself | 6 | 2013–2016 |
| HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO LTD | 5 | 2021 |
| HU SHUIQING | 3 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Ventura, California, US | 14 | 2014–2020 |
| Beijing, CN | 9 | 2013–2021 |
| Shanghai, CN | 2 | 2016–2019 |
| San Diego, California, US | 2 | 2014–2015 |
| Tuen Mun, HK | 1 | 2018 |