Inventor
Joseph J. Van Horn
Inventor
Underhill, VT, US
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables43%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1029%
H05KPrinted circuits14%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests14%
PatentTitleYear
6,747,472'Temporary device attach structure for test and burn in of microjoint interconnects and method for fabricating the same'20046,275,051'Segmented architecture for wafer test and burn-in'20016,255,208'Selective wafer-level testing and burn-in'20015,519,193'Method and apparatus for stressing, burning in and reducing leakage current of electronic devices using microwave radiation'1996Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1996–2004Patents assigned to IBM (4)· patent assignee history
1996–2004Based in Underhill, VT, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 4 | 1996–2004 |
Locations
| Location | Patents | Span |
|---|---|---|
| Underhill, VT, US | 4 | 1996–2004 |