Inventor
Hisaya Mori
Inventor
Hyogo, JP
Overview
Patents· 25 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables31%
B60NSeats specially adapted for vehicles23%
A47CChairs13%
G11CStatic stores10%
H03MCoding8%
B60RVehicles, vehicle fittings, or vehicle parts, not otherwise provided for5%
G01SRadio direction-finding3%
G06FElectric digital data processing3%
H04BTransmission3%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h103%
PatentTitleYear
10,486,570Vehicle headrest201910,361,746Semiconductor device and semiconductor system201910,279,718Vehicle headrest20199,616,791'Seat configuration member and vehicle seat employing the seat configuration member'20179,505,329'Vehicle seat and seat back board'20169,108,552'Vehicle seat and resin seatback spring'20159,073,467'Vehicle seat and seat back board'20158,979,204'Seat backboard and vehicle seat'20157,963,595'Vehicle seats'20117,931,330'Air conditioning seat'20117,079,060'Test circuit for evaluating characteristic of analog signal of device'20067,058,865'Apparatus for testing semiconductor integrated circuit'20066,990,614'Data storage apparatus and data measuring apparatus'20066,934,648'Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal'20056,900,627'Apparatus and method for testing semiconductor integrated circuit'20056,714,888'Apparatus for testing semiconductor integrated circuit'20046,690,189'Apparatus and method for testing semiconductor integrated circuit'20046,661,248'Tester for semiconductor integrated circuits'20036,653,855'External test auxiliary device to be used for testing semiconductor device'20036,651,023'Semiconductor test apparatus, and method of testing semiconductor device'20036,642,736'Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuits'20036,634,004'Threshold analysis system capable of deciding all threshold voltages included in memory device through single processing'20036,628,137'Apparatus and method for testing semiconductor integrated circuit'20036,587,975'Semiconductor test apparatus and method'20036,456,102'External test ancillary device to be used for testing semiconductor device, and method of testing semiconductor device using the device'2002Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2002–2005Patents assigned to RYODEN SEMICONDUCTOR SYST ENG (11)· patent assignee history
2002–2003Patents assigned to MITSUBISHI ELECTRIC CORP (6)· patent assignee history
2002–2006Based in Hyogo, JP· patent location history
2003–2006Patents assigned to RENESAS TECH CORP (7)· patent assignee history
2011–2019Based in Aichi, JP· patent location history
2015–2017Patents assigned to AWATA SHINJI (5)· patent assignee history
2015–2017Patents assigned to MORI HISAYA (5)· patent assignee history
2015–2017Based in Toyota, JP· patent location history
2019Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| RYODEN SEMICONDUCTOR SYST ENG | 11 | 2002–2005 |
| RENESAS TECH CORP | 7 | 2003–2006 |
| MITSUBISHI ELECTRIC CORP | 6 | 2002–2003 |
| AWATA SHINJI | 5 | 2015–2017 |
| MORI HISAYAself | 5 | 2015–2017 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hyogo, JP | 15 | 2002–2006 |
| Aichi, JP | 7 | 2011–2019 |
| Toyota, JP | 2 | 2015–2017 |
| Tokyo, JP | 1 | 2019 |