LexDanaLexDanabeta
Inventor

Rajesh Mittal

Inventor
Bangalore, IN

Overview

18→
Patents
2014–2020
Patent span
Physics
Primary field (CPC G)

Patents· 18 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables76%
G06FElectric digital data processing10%
G10LSpeech analysis techniques or speech synthesis10%
G11CStatic stores5%
PatentTitleYear
10,877,093Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputs202010,832,668Dynamic speech processing202010,739,402Generating multiple pseudo static control signals using on-chip JTAG state machine202010,515,637Dynamic speech processing201910,274,538Full pad coverage boundary scan201910,088,525Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputs201810,060,979Generating multiple pseudo static control signals using on-chip JTAG state machine20189,970,987Method and apparatus for test time reduction using fractional data packing20189,791,505'Full pad coverage boundary scan'20179,772,376'Increase data transfer throughput by enabling dynamic JTAG test mode entry and sharing of all JTAG pins'20179,581,645'Test circuit providing different levels of concurrency among radio cores'20179,535,123'Frequency scaled segmented scan chain for integrated circuits'20179,448,284'Method and apparatus for test time reduction using fractional data packing'20169,347,991'Scan throughput enhancement in scan testing of a device-under-test'20169,261,560'Handling slower scan outputs at optimal frequency'20169,239,360'DFT approach to enable faster scan chain diagnosis'20168,972,807'Integrated circuits capable of generating test mode control signals for scan tests'20158,694,276'Built-in self-test methods, circuits and apparatus for concurrent test of RF modules with a dynamically configurable test structure'2014

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2014–2020Patents assigned to TEXAS INSTRUMENTS INC (16)· patent assignee history
2014Patents assigned to MITTAL RAJESH KUMAR (1)· patent assignee history
2014–2020Based in Bangalore, IN· patent location history
2015Patents assigned to MITTAL RAJESH (1)· patent assignee history
2015Patents assigned to NARAYANAN PRAKASH (1)· patent assignee history
2017–2020Based in Karnataka, IN· patent location history
2019–2020Patents assigned to AMAZON TECH INC (2)· patent assignee history
2019–2020Based in Milpitas, CA, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TEXAS INSTRUMENTS INC162014–2020
AMAZON TECH INC22019–2020
MITTAL RAJESHself12015
MITTAL RAJESH KUMARself12014
NARAYANAN PRAKASH12015
Locations
LocationPatentsSpan
Bangalore, IN142014–2020
Karnataka, IN22017–2020
Milpitas, California, US22019–2020