Inventor
KUANG-SHING CHEN
Inventor
TW
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties38%
G06TImage data processing or generation, in general31%
G06NComputing arrangements based on specific computational models15%
H01LSemiconductor devices8%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h108%
PatentTitleYear
12,387,318Hot spot defect detecting method and hot spot defect detecting system202512,243,218Method and system for scanning wafer202511,984,365Semiconductor structure inspection using a high atomic number material202411,900,586Hot spot defect detecting method and hot spot defect detecting system202411,783,469Method and system for scanning wafer2023Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2023–2025Patents assigned to TAIWAN SEMICONDUCTOR MFG CO LTD (5)· patent assignee history
2023–2025Based in TW· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TAIWAN SEMICONDUCTOR MFG CO LTD | 5 | 2023–2025 |
Locations
| Location | Patents | Span |
|---|---|---|
| TW | 5 | 2023–2025 |