Inventor

Toshiyuki Enda

Inventor
Zushi, JP

Overview

19→
Patents
1998–2020
Patent span
Electricity
Primary field (CPC H)

Patents· 19 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Bprimary
H10BElectronic memory devices29%
G11CStatic stores26%
H10DInorganic electric semiconductor devices26%
G06FElectric digital data processing11%
G01RMeasuring electric variables3%
H01LSemiconductor devices3%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h103%
PatentTitleYear
10,847,223Storage device20209,030,881'Nonvolatile semiconductor memory device'20158,964,459'Magnetoresistive element and writing method of magnetic memory'20158,809,931'Nonvolatile semiconductor memory device'20148,633,535'Nonvolatile semiconductor memory'20148,165,852'Simulation apparatus for a semiconductor device'20127,956,408'Nonvolatile semiconductor memory device'20117,764,542'Method for programming a semiconductor memory device'20107,755,134'Nonvolatile semiconductor memory device'20107,539,055'Non-volatile semiconductor memory and method for controlling a non-volatile semiconductor memory'20097,528,447'Non-volatile semiconductor memory and method for controlling a non-volatile semiconductor memory'20097,459,748'Semiconductor memory device'20087,393,748'Method of fabricating a semiconductor memory device'20086,784,006'Semiconductor device, method of manufacturing semiconductor device, and system for evaluating electrical characteristics of semiconductor device'20046,304,834'Method and apparatus for semiconductor device simulation with linerly changing quasi-fermi potential, medium storing program for the simulation, and manufacturing method for the semiconductor device'20016,195,790'Electrical parameter evaluation system, electrical parameter evaluation method, and computer-readable recording medium for recording electrical parameter evaluation program'20016,051,452'Method for manufacturing a semiconductor device with ion implantation'20005,889,687'Simulator, simulation and fabrication methods of semiconductor device and storage medium storing program for executing the simulation method'19995,760,442'Semiconductor device of a silicon on insulator metal-insulator type with a concave feature'1998

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1998–2015Patents assigned to TOSHIBA KK (18)· patent assignee history
1998–2000Based in Chigasaki, JP· patent location history
1999–2004Based in Kanagawa, JP· patent location history
2001Based in Tokyo, JP· patent location history
2008–2015Based in Zushi, JP· patent location history
2012–2014Patents assigned to ENDA TOSHIYUKI (2)· patent assignee history
2014Patents assigned to AOKI NOBUTOSHI (1)· patent assignee history
2014Patents assigned to IINUMA TOSHIHIKO (1)· patent assignee history
2014Patents assigned to MATSUO KOUJI (1)· patent assignee history
2020Based in Yokohama-shi, Kanagawa, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TOSHIBA KK181998–2015
ENDA TOSHIYUKIself22012–2014
AOKI NOBUTOSHI12014
IINUMA TOSHIHIKO12014
MATSUO KOUJI12014
Locations
LocationPatentsSpan
Zushi, JP122008–2015
Kanagawa, JP21999–2004
Tokyo, JP22001
Chigasaki, JP21998–2000
Yokohama-shi, Kanagawa, JP12020