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Inventor

Masaru Sanada

Inventor
Tokyo, JP

Overview

15→
Patents
1991–2005
Patent span
Physics
Primary field (CPC G)

Patents· 15 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables36%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1021%
F25BRefrigeration machines, plants or systems7%
Y02ATechnologies for adaptation to climate change7%
Y02BClimate change mitigation technologies related to buildings, e.g. housing, house appliances or related end-user applications7%
B66BElevators4%
G11CStatic stores4%
H04NPictorial communication, e.g. television4%
H10DInorganic electric semiconductor devices4%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests4%
PatentTitleYear
6,883,115'LSI diagnostic system and method of diagnosing LSI'20056,285,040'Internal-logic inspection circuit'20016,173,426'Method of locating faults in LSI'20016,144,084'Semiconductor integrated circuit having a logic verifying structure and method of manufacturing the same'20006,136,618'Semiconductor device manufacturing process diagnosis system suitable for diagnoses of manufacturing process of logic LSI composed of a plurality of logic circuit blocks and diagnosis method thereof'20006,041,617'Adsorption type cooling apparatus, method of controlling cold output of same, and fin type adsorbent heat exchanger for use in same'20005,944,847'Method and system for identifying failure point'19995,943,346'Fault point estimating system using abnormal current and potential contrast images'19995,889,789'Fault mode estimating system using abnormal current and V-I characteristics'19995,864,566'Fault block detecting system using abnormal current and abnormal data output'19995,850,404'Fault block detecting system using abnormal current'19985,732,569'Adsorption type cooling apparatus, method of controlling cold output of same, and fin type adsorbent heat exchanger for use in the same'19985,640,099'Method and apparatus for detecting short circuit point between wiring patterns'19975,329,139'Semiconductor integrated circuit device analyzable by using laser beam inducing current'19945,024,314'Escalator system with convertible steps for wheel chair'1991

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1991Patents assigned to MITSUBISHI ELECTRIC CORP (1)· patent assignee history
1991Based in Osaka, JP· patent location history
1994–2001Patents assigned to NEC CORP (9)· patent assignee history
1994–2005Based in Tokyo, JP· patent location history
1998–2000Patents assigned to MAEKAWA SEISAKUSHO KK (2)· patent assignee history
1999Patents assigned to NEC COPORATION (1)· patent assignee history
2005Patents assigned to NEC ELECTRONICS CORP (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
NEC CORP91994–2001
MAEKAWA SEISAKUSHO KK21998–2000
MITSUBISHI ELECTRIC CORP11991
NEC COPORATION11999
NEC ELECTRONICS CORP12005
Locations
LocationPatentsSpan
Tokyo, JP141994–2005
Osaka, JP11991