Inventor
Takashi Ide
Inventor
Kanagawa, JP
Overview
Patents· 22 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Dprimary
H10DInorganic electric semiconductor devices15%
G06FElectric digital data processing13%
H01LSemiconductor devices10%
G01MTesting static or dynamic balance of machines or structures8%
G01NInvestigating or analysing materials by determining their chemical or physical properties8%
G03GElectrography8%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h108%
H04NPictorial communication, e.g. television5%
B60RVehicles, vehicle fittings, or vehicle parts, not otherwise provided for3%
B65HHandling thin or filamentary material, e.g. sheets, webs, cables3%
PatentTitleYear
10,985,542Wire protecting protector and protector-equipped wire202110,649,844Memory system202010,566,183Method of manufacturing semiconductor device and the semiconductor device202010,074,740Semiconductor device20189,739,233'Piston of internal combustion engine'20179,722,066'Semiconductor device'20179,304,691'Memory system and bank interleaving method'20169,293,457'Semiconductor device'20169,286,208'Controller controlling an interleave operation, solid-state drive including the controller, and control method controlling an interleave operation'20168,996,782'Memory system and bank interleaving method'20158,058,695'Semiconductor device'20117,879,722'Semiconductor device and method of manufacturing the same'20117,187,388'Spreadsheet data manipulation of two-dimensional data structures with recording capability and activation means'20076,920,295'Image forming apparatus'20056,603,937'Image forming apparatus'20036,546,313'Image forming apparatus'20036,323,484'Method and apparatus for sample current spectroscopy surface measurement'20016,144,443'Apparatus and method for measuring crystal lattice strain'20005,995,218'Method for inspecting defects of wafer and inspection equipment thereof'19994,714,343'Optical fiber characteristic measurement'19874,676,635'Optical fiber characteristic measuring method and apparatus'19874,636,070'Apparatus for measuring the cut-off wavelength of a single-mode optical fiber'1987Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1987Patents assigned to SUMITOMO ELECTRIC INDUSTRIES (3)· patent assignee history
1987–2020Based in Kanagawa, JP· patent location history
1987–2016Based in Yokohama, JP· patent location history
1999–2001Patents assigned to NEC CORP (3)· patent assignee history
1999–2001Based in Tokyo, JP· patent location history
2003–2005Patents assigned to SHARP KK (3)· patent assignee history
2003–2005Based in Osaka, JP· patent location history
2011–2020Patents assigned to RENESAS ELECTRONICS CORP (6)· patent assignee history
2015–2016Patents assigned to TOSHIBA KK (3)· patent assignee history
2021Based in Mie, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| RENESAS ELECTRONICS CORP | 6 | 2011–2020 |
| NEC CORP | 3 | 1999–2001 |
| SHARP KK | 3 | 2003–2005 |
| SUMITOMO ELECTRIC INDUSTRIES | 3 | 1987 |
| TOSHIBA KK | 3 | 2015–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kanagawa, JP | 10 | 1987–2020 |
| Tokyo, JP | 3 | 1999–2001 |
| Yokohama, JP | 2 | 1987–2016 |
| Osaka, JP | 2 | 2003–2005 |
| Mie, JP | 1 | 2021 |