Inventor
Adam Duncan
Inventor
Bloomington, IN, US
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores20%
G01RMeasuring electric variables16%
G06FElectric digital data processing10%
H01LSemiconductor devices10%
H10DInorganic electric semiconductor devices10%
H03KPulse technique8%
G01TMeasurement of nuclear or x-radiation4%
G05BControl or regulating systems in general4%
G06KGraphical data reading4%
H10BElectronic memory devices4%
PatentTitleYear
10,855,287Non-volatile multiple time programmable integrated circuit system with selective conversion to one time programmable or permanent configuration bit programming capabilities and related methods202010,833,658Apparatuses and methods using current-starved ring oscillator biased by floating gate transistors with a variety of applications including as a power-free radiation detector or silicon age determination or odometer system202010,247,781Compact electronics test system having user programmable device interfaces and on-board functions adapted for use in proximity to a radiation field201910,204,875Systems and methods for inhibiting backend access to integrated circuits by integrating photon and electron sensing latch-up circuits201910,107,858Digital test system20189,753,445'DUT continuity test with only digital IO structures apparatus and methods associated thereof'20179,747,996'Method and system for improving the radiation tolerance of floating gate memories'20179,684,025'DUT continuity test with only digital IO structures apparatus and methods associated thereof'20179,685,231'Irreproducible and re-emergent unique structure or pattern identifier manufacturing and detection method, system, and apparatus'20179,620,242'Methods and apparatuses including one or more interrupted integrated circuit operations for characterizing radiation effects in integrated circuits'20179,601,201'Irreproducible and re-emergent unique structure or pattern identifier manufacturing and detection method, system, and apparatus'20179,601,214'Method and system for improving the radiation tolerance of floating gate memories'20179,594,117'Compact electronics test system having user programmable device interfaces and on-board functions adapted for use in proximity to a radiation field'20179,595,519'Combination metal oxide semi-conductor field effect transistor (MOSFET) and junction field effect transistor (JFET) operable for modulating current voltage response or mitigating electromagnetic or radiation interference effects by altering current flow through the MOSFETs semi-conductive channel region (SCR)'20179,590,611'Radiation-hardened dual gate semiconductor transistor devices containing various improved structures including MOSFET gate and JFET gate structures and related methods'20179,536,620'Method and system for improving the radiation tolerance of floating gate memories'20179,431,133'Digital test system'20169,425,803'Apparatuses and methods for implementing various physically unclonable function (PUF) and random number generator capabilities'20169,417,286'Sensor enhancement through algorithmic acquisition using synchronization with a scan generator'20169,263,139'Method and system for improving the radiation tolerance of floating gate memories'2016Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2016–2020Patents assigned to US NAVY (20)· patent assignee history
2016Patents assigned to DUNCAN ADAM (1)· patent assignee history
2016Patents assigned to GADLAGE MATTHEW (1)· patent assignee history
2016–2020Based in Bloomington, IN, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| US NAVY | 20 | 2016–2020 |
| DUNCAN ADAMself | 1 | 2016 |
| GADLAGE MATTHEW | 1 | 2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Bloomington, IN, US | 20 | 2016–2020 |