Inventor
Chunsheng Huang
Inventor
San Jose, CA, US
Overview
Patents· 11 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions20%
G01NInvestigating or analysing materials by determining their chemical or physical properties16%
G02BOptical elements, systems or apparatus12%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h108%
B64CAeroplanes4%
B64UUnmanned aerial vehicles [uav]4%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light4%
G01MTesting static or dynamic balance of machines or structures4%
G05BControl or regulating systems in general4%
H01LSemiconductor devices4%
PatentTitleYear
11,129,082Method of route construction of UAV network, UAV and storage medium thereof202110,809,055Apparatus and method for measuring topography and gradient of the surfaces, shape, and thickness of patterned and unpatterned wafers202010,732,424Inspection-beam shaping on a sample surface at an oblique angle of incidence202010,324,045Surface defect inspection with large particle monitoring and laser power control20199,903,708'Method and apparatus to fold optics in tools for measuring shape and/or thickness of a large and thin substrate'20189,279,663'Method and apparatus to fold optics in tools for measuring shape and/or thickness of a large and thin substrate'2016D0580435'External hard disk drive'20087,433,034'Darkfield defect inspection with spectral contents'20087,061,613'Polarizing beam splitter and dual detector calibration of metrology device having a spatial phase modulation'20065,416,586'Method of testing aspherical optical surfaces with an interferometer'19955,349,434'Method of measuring artifact taper'1994Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1994–1995Patents assigned to TROPEL CORP (2)· patent assignee history
1994–2020Based in San Jose, CA, US· patent location history
2006–2008Patents assigned to NANOMETRICS INC (2)· patent assignee history
2008Patents assigned to ESGW HOLDINGS LTD (1)· patent assignee history
2008Based in Shenzhen, CN· patent location history
2016–2020Patents assigned to KLA TENCOR CORP (4)· patent assignee history
2019Based in Milpitas, CA, US· patent location history
2020Patents assigned to KLA CORP (2)· patent assignee history
2021Based in Beijing, CN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA TENCOR CORP | 4 | 2016–2020 |
| KLA CORP | 2 | 2020 |
| NANOMETRICS INC | 2 | 2006–2008 |
| TROPEL CORP | 2 | 1994–1995 |
| ESGW HOLDINGS LTD | 1 | 2008 |
Locations
| Location | Patents | Span |
|---|---|---|
| San Jose, California, US | 8 | 1994–2020 |
| Beijing, CN | 1 | 2021 |
| Milpitas, California, US | 1 | 2019 |
| Shenzhen, CN | 1 | 2008 |