Inventor
Michael A. Ziegerhofer
Inventor
Jeffersonville, VT, US
Overview
Patents· 23 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores61%
G06FElectric digital data processing26%
G01RMeasuring electric variables6%
H03MCoding6%
PatentTitleYear
10,971,243Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register202110,950,325Memory built-in self test error correcting code (MBIST ECC) for low voltage memories202110,839,931Zero test time memory using background built-in self-test202010,692,584Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register202010,553,302Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register202010,490,296Memory built-in self-test (MBIST) test time reduction201910,438,678Zero test time memory using background built-in self-test20199,881,694'Built-in-self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register'20189,859,019'Programmable counter to control memory built in self-test'20189,286,181'Apparatus for capturing results of memory testing'20168,935,586'Staggered start of BIST controllers and BIST engines'20158,918,690'Decreasing power supply demand during BIST initializations'20148,719,648'Interleaving of memory repair data compression and fuse programming operations in single fusebay architecture'20148,595,678'Validating interconnections between logic blocks in a circuit description'20138,570,820'Selectable repair pass masking'20138,537,627'Determining fusebay storage element usage'20138,484,543'Fusebay controller structure, system, and method'20138,467,260'Structure and method for storing multiple repair pass data into a fusebay'20138,214,699'Circuit structure and method for digital integrated circuit performance screening'20127,895,028'Structure for increasing fuse programming yield'20117,826,288'Device threshold calibration through state dependent burn-in'20107,757,141'Automatically extensible addressing for shared array built-in self-test (ABIST) circuitry'20107,251,756'Method and apparatus for increasing fuse programming yield through preferred use of duplicate data'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007–2021Patents assigned to IBM (18)· patent assignee history
2007–2021Based in Jeffersonville, VT, US· patent location history
2012–2014Patents assigned to ZIEGERHOFER MICHAEL A (6)· patent assignee history
2013–2014Patents assigned to OUELLETTE MICHAEL R (5)· patent assignee history
2013–2014Patents assigned to GORMAN KEVIN W (3)· patent assignee history
2016–2019Patents assigned to GLOBALFOUNDRIES INC (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 18 | 2007–2021 |
| ZIEGERHOFER MICHAEL Aself | 6 | 2012–2014 |
| OUELLETTE MICHAEL R | 5 | 2013–2014 |
| GLOBALFOUNDRIES INC | 3 | 2016–2019 |
| GORMAN KEVIN W | 3 | 2013–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Jeffersonville, VT, US | 23 | 2007–2021 |