Inventor
Hongwei Ye
Inventor
Kenosha, WI, US
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Tprimary
G01TMeasurement of nuclear or x-radiation40%
G06TImage data processing or generation, in general30%
A61BDiagnosis20%
G06FElectric digital data processing10%
PatentTitleYear
10,216,701Image-based point-spread-function modelling in time-of-flight positron-emission-tomography iterative list-mode reconstruction20199,804,275'Method and system of random-event-based count-rate adaptive normalization for PET detector efficiency'20179,483,850'Cylinder source software-positioning method for PET calibration and image quality assurance'20169,286,701'Method and apparatus for estimating scatter in a positron emission tomography scan at multiple bed positions'20168,787,644'Method and device for calculating voxels defining a tube-of-response using a central-ray-filling algorithm'20148,718,973'Method, device, and system for calculating a geometric system model using an area-simulating-volume algorithm in three dimensional reconstruction'2014Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2014–2019Patents assigned to TOSHIBA MEDICAL SYS CORP (6)· patent assignee history
2014–2016Patents assigned to TOSHIBA KK (3)· patent assignee history
2014Patents assigned to WANG WENLI (2)· patent assignee history
2014Patents assigned to YE HONGWEI (2)· patent assignee history
2014–2019Based in Kenosha, WI, US· patent location history
2019Patents assigned to UNIV CALIFORNIA (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOSHIBA MEDICAL SYS CORP | 6 | 2014–2019 |
| TOSHIBA KK | 3 | 2014–2016 |
| WANG WENLI | 2 | 2014 |
| YE HONGWEIself | 2 | 2014 |
| UNIV CALIFORNIA | 1 | 2019 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kenosha, WI, US | 6 | 2014–2019 |