Inventor
TOMOKI ONISHI
Inventor
JP
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables30%
C09KMaterials for miscellaneous applications, not provided for elsewhere10%
E21BEarth or rock drilling10%
G01NInvestigating or analysing materials by determining their chemical or physical properties10%
G02BOptical elements, systems or apparatus10%
G11CStatic stores10%
H01FMagnets10%
H10BElectronic memory devices10%
PatentTitleYear
12,560,792Polarized microscope and intra image field correction analysis method202612,439,607Inspection device202512,327,579Inspection device202511,939,855Diverting agent, method for temporarily filling fracture in well using same, and method for further forming fracture202411,796,608Magnetic property measurement apparatus2023Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2023–2026Patents assigned to SAMSUNG ELECTRONICS CO LTD (4)· patent assignee history
2023–2026Based in JP· patent location history
2024Patents assigned to MITSUBISHI CHEM CORP (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SAMSUNG ELECTRONICS CO LTD | 4 | 2023–2026 |
| MITSUBISHI CHEM CORP | 1 | 2024 |
Locations
| Location | Patents | Span |
|---|---|---|
| JP | 5 | 2023–2026 |