Inventor
Hitoshi Abiko
Inventor
Tokyo, JP
Overview
Patents· 10 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Dprimary
H10DInorganic electric semiconductor devices28%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1022%
H10BElectronic memory devices11%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests11%
C23CCoating metallic material6%
H01JElectric discharge tubes or discharge lamps6%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation6%
PatentTitleYear
7,719,042'Semiconductor device'20107,701,026'Imaging device'20106,559,495'Semiconductor memory cell device'20036,544,827'Metal-gate field effect transistor and method for manufacturing the same'20036,309,515'Sputtering apparatus for sputtering high melting point metal and method for manufacturing semiconductor device having high melting point metal'20016,281,094'Method of fabricating semiconductor device capable of providing MOSFET which is improved in a threshold voltage thereof'20016,051,472'Semiconductor device and method of producing the same'20005,937,286'Method for manufacturing semiconductor device'19995,691,225'Method for fabricating semiconductor device having CMOS structure'19975,677,233'Process of fabricating semiconductor device having isolating oxide rising out of groove'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997–2003Patents assigned to NEC CORP (7)· patent assignee history
1997–2003Based in Tokyo, JP· patent location history
2003–2010Patents assigned to NEC ELECTRONICS CORP (3)· patent assignee history
2010Based in Kanagawa, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NEC CORP | 7 | 1997–2003 |
| NEC ELECTRONICS CORP | 3 | 2003–2010 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 8 | 1997–2003 |
| Kanagawa, JP | 2 | 2010 |