Inventor
Frank O. Uher
Inventor
Los Altos, CA, US
Overview
Patents· 21 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables39%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1026%
G06FElectric digital data processing22%
C23CCoating metallic material4%
Y10TTechnical subjects covered by former us classification4%
B23QDetails, components, or accessories for machine tools, e.g. arrangements for copying or controlling2%
F16BDevices for fastening or securing constructional elements or machine parts together, e.g. nails, bolts, circlips, clamps, clips or wedges2%
PatentTitleYear
10,852,347Apparatus for testing electronic devices202010,094,872Apparatus for testing electronic devices20189,316,683'Apparatus for testing electronic devices'20169,151,797'Apparatus for testing electronic devices'20158,747,123'Apparatus for testing electronic devices'20148,628,336'Apparatus for testing electronic devices'20148,506,335'Apparatus for testing electronic devices'20138,388,357'Apparatus for testing electronic devices'20138,118,618'Apparatus for testing electronic devices'20127,762,822'Apparatus for testing electronic devices'20107,541,822'Wafer burn-in and text employing detachable cartridge'20097,301,358'Contactor assembly for testing electrical circuits'20077,088,117'Wafer burn-in and test employing detachable cartridge'20066,853,209'Contactor assembly for testing electrical circuits'20056,580,283'Wafer level burn-in and test methods'20036,556,032'Wafer-burn-in and test employing detachable cartridge'20036,413,113'Kinematic coupling'20026,340,895'Wafer-level burn-in and test cartridge'20026,217,367'Kinematic coupling'20015,447,570'Purge gas in wafer coating area selection'19955,387,289'Film uniformity by selective pressure gradient control'1995Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1995–2020Based in Los Altos, CA, US· patent location history
2002–2020Patents assigned to AEHR TEST SYSTEMS (15)· patent assignee history
2012–2014Patents assigned to BURKE PAUL W (4)· patent assignee history
2012–2014Patents assigned to CAO DOAN D (4)· patent assignee history
2012–2014Patents assigned to CARBONE MARK C (4)· patent assignee history
2012–2014Patents assigned to DEBOE KENNETH W (4)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| AEHR TEST SYSTEMS | 15 | 2002–2020 |
| BURKE PAUL W | 4 | 2012–2014 |
| CAO DOAN D | 4 | 2012–2014 |
| CARBONE MARK C | 4 | 2012–2014 |
| DEBOE KENNETH W | 4 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Los Altos, California, US | 21 | 1995–2020 |