Inventor
Isamu Matsuyama
Inventor
Tokyo, JP
Overview
Patents· 3 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Dprimary
H10DInorganic electric semiconductor devices67%
G01MTesting static or dynamic balance of machines or structures33%
PatentTitleYear
7,994,035'Semiconductor device fabricating method including thermal oxidation of a substrate, forming a second oxide, and thermal processing a gate electrode'20116,037,615'Metal semiconductor FET having doped A1GaAs layer between channel layer and A1GaAs buffer layer'20004,656,509'Water leakage monitoring system'1987Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1987Patents assigned to MITSUBISHI ELECTRIC CORP (1)· patent assignee history
1987Based in Kobe, JP· patent location history
2000Patents assigned to OKI ELECTRIC IND CO LTD (1)· patent assignee history
2000Based in Toyko, JP· patent location history
2011Patents assigned to OKI SEMICONDUCTOR CO LTD (1)· patent assignee history
2011Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MITSUBISHI ELECTRIC CORP | 1 | 1987 |
| OKI ELECTRIC IND CO LTD | 1 | 2000 |
| OKI SEMICONDUCTOR CO LTD | 1 | 2011 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 1 | 2011 |
| Toyko, JP | 1 | 2000 |
| Kobe, JP | 1 | 1987 |