Inventor
Yutaka Nakadai
Inventor
Yachiyo, JP
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Kprimary
G06KGraphical data reading43%
G01RMeasuring electric variables29%
G06FElectric digital data processing29%
PatentTitleYear
10,664,370Multiple core analysis mode for defect analysis202010,656,201Semiconductor device20207,357,330'Semiconductor integrated circuit device and contactless IC card'20087,309,018'Semiconductor integrated circuit device and noncontact IC card'20077,044,393'Semiconductor integrated circuit device and contactless IC card'2006Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2006–2008Patents assigned to RENESAS TECH CORP (3)· patent assignee history
2006–2008Based in Yachiyo, JP· patent location history
2007Patents assigned to HITACHI HYBRID NETWORK CO LTD (1)· patent assignee history
2020Patents assigned to RENESAS ELECTRONICS CORP (2)· patent assignee history
2020Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| RENESAS TECH CORP | 3 | 2006–2008 |
| RENESAS ELECTRONICS CORP | 2 | 2020 |
| HITACHI HYBRID NETWORK CO LTD | 1 | 2007 |
Locations
| Location | Patents | Span |
|---|---|---|
| Yachiyo, JP | 3 | 2006–2008 |
| Tokyo, JP | 2 | 2020 |