Inventor
John Breuer
Inventor
München, DE
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps100%
PatentTitleYear
10,784,072Aberration-corrected multibeam source, charged particle beam device and method of imaging or illuminating a specimen with an array of primary charged particle beamlets202010,176,965Aberration-corrected multibeam source, charged particle beam device and method of imaging or illuminating a specimen with an array of primary charged particle beamlets20199,697,983'Thermal field emitter tip, electron beam device including a thermal field emitter tip and method for operating an electron beam device'20179,472,373'Beam separator device, charged particle beam device and methods of operating thereof'20169,349,566'Charged particle beam device, beam deflector device and methods of operating thereof'2016Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2016–2017Patents assigned to ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH (2)· patent assignee history
2016Patents assigned to INTEGRATED CIRCUIT TESTING (1)· patent assignee history
2016–2019Based in München, DE· patent location history
2019–2020Patents assigned to ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH (2)· patent assignee history
2020Based in Munich, DE· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH | 2 | 2019–2020 |
| ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH | 2 | 2016–2017 |
| INTEGRATED CIRCUIT TESTING | 1 | 2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| München, DE | 4 | 2016–2019 |
| Munich, DE | 1 | 2020 |