Inventor
Jun Iba
Inventor
Yokohama, JP
Overview
Patents· 41 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Fprimary
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation19%
H01LSemiconductor devices18%
H04NPictorial communication, e.g. television14%
G09GArrangements or circuits for control of indicating devices using static means to present variable information11%
H01JElectric discharge tubes or discharge lamps11%
G02BOptical elements, systems or apparatus9%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein4%
H04LTransmission of digital information, e.g. telegraphic communication3%
H01QAntennas, i.e. radio aerials2%
G01NInvestigating or analysing materials by determining their chemical or physical properties1%
PatentTitleYear
11,011,663Semiconductor element for oscillating or detecting terahertz wave and manufacturing method of semiconductor element202110,897,073Receiver for detecting a terahertz wave and image forming apparatus202110,861,897Imaging device and imaging system202010,812,673Line sensor, image reading device, and image forming apparatus202010,453,878Photoelectric conversion apparatus and image-reading apparatus201910,439,389Semiconductor device, semiconductor system, and electronic apparatus201910,412,253Line sensor, image reading device, and image forming apparatus201910,403,664Photoelectric conversion apparatus and imaging system201910,389,930Image pickup device and image pickup system201910,225,496Photoelectric conversion device having a holding circuit with a plurality of holding units provided for each of a plurality of columns of pixels and method of driving photoelectric conversion device201910,103,182Photoelectric conversion apparatus and image reading apparatus201810,063,732Line sensor, image reading device, and image forming apparatus201810,008,528Solid-state image sensor, method of manufacturing the same, and camera20189,831,278Solid-state image sensor and camera with pixel openings20179,599,754'Optical element array and solid-state imaging device including the array'20179,386,249'Image pickup apparatus'20169,285,510'Optical element array and solid-state imaging device including the array'20169,274,254'Optical element array, photoelectric conversion apparatus, and image pickup system'20169,261,769'Imaging apparatus and imaging system'20168,378,937'Image display apparatus'20138,080,928'Electron-emitting device and image display apparatus using the same'20117,969,082'Electron beam apparatus'20117,923,913'Image display apparatus'20117,837,529'Electron-emitting device and manufacturing method thereof'20107,795,795'Electron beam apparatus having an electrode with high temperature portion'20107,710,010'Electron beam apparatus'20107,507,134'Method for producing electron beam apparatus'20097,427,826'Electron beam apparatus'20087,382,088'Electron source and image display apparatus'20086,992,649'Driving method for liquid crystal device'20066,992,447'Electron beam generation device having spacer'20066,473,117'Driving method for liquid crystal device'20026,456,266'Liquid crystal display apparatus'20026,452,581'Driving method for liquid crystal device and liquid crystal apparatus'20026,323,850'Driving method for liquid crystal device'20016,222,517'Liquid crystal apparatus'20016,072,555'Display apparatus capable of gradational display'20006,028,579'Driving method for liquid crystal devices'20005,995,076'Liquid crystal apparatus using different types of drive waveforms alternately'19995,854,665'Liquid crystal device with optical member having a planar extension in parallel with the substrates and non-uniform optical anisotropy along the planar extension'19985,303,032'Method of measuring the time for forming refractive index grating of a photo-nonlinear medium'1994Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1994Patents assigned to MITSUBISHI MATERIALS CORP (1)· patent assignee history
1994Based in Tokyo, JP· patent location history
1998–2021Patents assigned to CANON KK (40)· patent assignee history
1998–2000Based in Atsugi, JP· patent location history
2000–2021Based in Yokohama, JP· patent location history
2006–2009Based in Kanagawa, JP· patent location history
2011–2013Patents assigned to AZUMA HISANOBU (2)· patent assignee history
2011–2013Patents assigned to IBA JUN (2)· patent assignee history
2011Patents assigned to HIROKI TAMAYO (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| CANON KK | 40 | 1998–2021 |
| AZUMA HISANOBU | 2 | 2011–2013 |
| IBA JUNself | 2 | 2011–2013 |
| HIROKI TAMAYO | 1 | 2011 |
| MITSUBISHI MATERIALS CORP | 1 | 1994 |
Locations
| Location | Patents | Span |
|---|---|---|
| Yokohama, JP | 33 | 2000–2021 |
| Kanagawa, JP | 4 | 2006–2009 |
| Atsugi, JP | 3 | 1998–2000 |
| Tokyo, JP | 1 | 1994 |