Inventor
JHE-RUEI LI
Inventor
TW
Overview
Patents· 3 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions60%
G06TImage data processing or generation, in general40%
PatentTitleYear
12,548,254Three-dimensional imaging system and three-dimensional imaging method202612,444,043Non-contact detection device and detection method thereof202512,196,542Phase shift-based three-dimensional measurement system with multiple calibration surfaces and calibration method thereof2025Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2025–2026Patents assigned to IND TECH RES INST (3)· patent assignee history
2025–2026Based in TW· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IND TECH RES INST | 3 | 2025–2026 |
Locations
| Location | Patents | Span |
|---|---|---|
| TW | 3 | 2025–2026 |