Inventor
Tobias Schaffter
Inventor
Hamburg, DE
Overview
Patents· 9 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables89%
A61BDiagnosis11%
PatentTitleYear
9,173,573'Imaging an object of interest'20157,999,543'MR method for spatially-resolved determination of relaxation parameters'20117,471,085'Determination of relaxation rate changes for MR molecular imaging'20087,332,909'MR imaging method'20086,741,882'MR device and MR method for localizing and/or visualizing a medical instrument provided with a passive magnet device'20046,005,391'Method for determining the spatial and/or spectral distribution of nuclear magnetization'19995,977,769'MR method with reduced motion artefacts'19995,767,676'MR spectroscopy method for measuring plural voxels at intersections of slices'19985,755,666'Method and device for imaging a curved region by means of magnetic resonance'1998Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1998–1999Patents assigned to PHILIPS CORP (4)· patent assignee history
1998–2015Based in Hamburg, DE· patent location history
2004–2011Patents assigned to KONINKL PHILIPS ELECTRONICS NV (4)· patent assignee history
2008Based in Blackheath, GB· patent location history
2015Patents assigned to KONINKL PHILIPS NV (1)· patent assignee history
2015Patents assigned to SCHAFFTER TOBIAS (1)· patent assignee history
2015Patents assigned to WEIΒ STEFFEN (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KONINKL PHILIPS ELECTRONICS NV | 4 | 2004–2011 |
| PHILIPS CORP | 4 | 1998–1999 |
| KONINKL PHILIPS NV | 1 | 2015 |
| SCHAFFTER TOBIASself | 1 | 2015 |
| WEIΒ STEFFEN | 1 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hamburg, DE | 8 | 1998–2015 |
| Blackheath, GB | 1 | 2008 |