Inventor
Akiyuki Sugiyama
Inventor
Hitachinaka, JP
Overview
Patents· 30 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Tprimary
G06TImage data processing or generation, in general24%
H01JElectric discharge tubes or discharge lamps23%
G06VImage or video recognition or understanding12%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices11%
G01BMeasuring length, thickness or similar linear dimensions7%
G01NInvestigating or analysing materials by determining their chemical or physical properties5%
H01LSemiconductor devices5%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%
B82YSpecific uses or applications of nanostructures4%
G06FElectric digital data processing3%
PatentTitleYear
11,124,549Modified biotin, streptavidin mutant, and usage of them202110,732,512Image processor, method for generating pattern using self-organizing lithographic techniques and computer program202010,545,018Pattern measurement device, and computer program for measuring pattern20209,804,107'Pattern measurement device and computer program for evaluating patterns based on centroids of the patterns'20179,704,235'Semiconductor inspection system'20178,867,818'Method of creating template for matching, as well as device for creating template'20148,788,242'Pattern measurement apparatus'20148,577,124'Method and apparatus of pattern inspection and semiconductor inspection system using the same'20138,515,153'System and method of image processing, and scanning electron microscope'20138,507,856'Pattern measuring method and pattern measuring device'20138,445,871'Pattern measurement apparatus'20138,355,562'Pattern shape evaluation method'20138,338,804'Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatus'20128,311,314'Pattern measuring method and pattern measuring device'20128,285,056'Method and apparatus for computing degree of matching'20128,244,042'Pattern matching method and computer program for executing pattern matching'20128,173,962'Pattern displacement measuring method and pattern measuring device'20128,115,169'Method and apparatus of pattern inspection and semiconductor inspection system using the same'20128,094,920'System and method of image processing, and scanning electron microscope'20128,019,161'Method, device and computer program of length measurement'20117,941,008'Pattern search method'20117,923,703'Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatus'20117,925,095'Pattern matching method and computer program for executing pattern matching'20117,889,909'Pattern matching method and pattern matching program'20117,772,554'Charged particle system'20107,732,792'Pattern measurement apparatus'20107,679,055'Pattern displacement measuring method and pattern measuring device'20107,518,110'Pattern measuring method and pattern measuring device'20097,507,961'Method and apparatus of pattern inspection and semiconductor inspection system using the same'20097,449,689'Dimension measuring SEM system, method of evaluating shape of circuit pattern and a system for carrying out the method'2008Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2008–2020Patents assigned to HITACHI HIGH TECH CORP (29)· patent assignee history
2008–2014Based in Hitachinaka, JP· patent location history
2012–2017Patents assigned to SUGIYAMA AKIYUKI (15)· patent assignee history
2012–2014Patents assigned to MATSUOKA RYOICHI (10)· patent assignee history
2012–2013Patents assigned to SUTANI TAKUMICHI (6)· patent assignee history
2012–2014Patents assigned to TOYODA YASUTAKA (6)· patent assignee history
2017–2021Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 29 | 2008–2020 |
| SUGIYAMA AKIYUKIself | 15 | 2012–2017 |
| MATSUOKA RYOICHI | 10 | 2012–2014 |
| SUTANI TAKUMICHI | 6 | 2012–2013 |
| TOYODA YASUTAKA | 6 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hitachinaka, JP | 25 | 2008–2014 |
| Tokyo, JP | 5 | 2017–2021 |