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Inventor

Kwokkam Leung

Inventor
Hong Kong, CN

Overview

2→
Patents
2015–2018
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables40%
G11BInformation storage based on relative movement between record carrier and transducer40%
B82YSpecific uses or applications of nanostructures20%
PatentTitleYear
9,899,046'Method of testing anti-high temperature performance of a magnetic head and apparatus thereof'20189,121,888'Method of testing anti-high temperature performance of a magnetic head and apparatus thereof'2015

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2015–2018Patents assigned to DING JUREN (2)· patent assignee history
2015–2018Patents assigned to LAM HOKEI (2)· patent assignee history
2015–2018Patents assigned to LEE MANKIT (2)· patent assignee history
2015–2018Patents assigned to LEUNG CHEUKWING (2)· patent assignee history
2015–2018Patents assigned to LEUNG KWOKKAM (2)· patent assignee history
2015–2018Based in Hong Kong, CN· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
DING JUREN22015–2018
LAM HOKEI22015–2018
LEE MANKIT22015–2018
LEUNG CHEUKWING22015–2018
LEUNG KWOKKAMself22015–2018
Locations
LocationPatentsSpan
Hong Kong, CN22015–2018