Inventor
Hans-Michael Stiepan
Inventor
Aalen, DE
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions27%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices27%
G01MTesting static or dynamic balance of machines or structures20%
B21DWorking or processing of sheet metal or metal tubes, rods or profiles without essentially removing material7%
C03BManufacture, shaping, or supplementary processes7%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
G02BOptical elements, systems or apparatus7%
PatentTitleYear
10,509,330Method and device for characterizing a wafer patterned using at least one lithography step201910,502,545Measuring method and measuring arrangement for an imaging optical system201910,422,718Test device and method for testing a mirror201910,337,850Interferometric measuring arrangement2019Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2019Patents assigned to ZEISS CARL SMT GMBH (4)· patent assignee history
2019Based in Aalen, DE· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ZEISS CARL SMT GMBH | 4 | 2019 |
Locations
| Location | Patents | Span |
|---|---|---|
| Aalen, DE | 4 | 2019 |