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Inventor

Matthew E. Chraft

Inventor
Copperopolis, CA, US

Overview

4→
Patents
2005–2013
Patent span
Physics
Primary field (CPC G)

Patents· 4 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables50%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1050%
PatentTitleYear
8,581,610'Method of designing an application specific probe card test system'20137,852,094'Sharing resources in a system for testing semiconductor devices'20107,307,433'Intelligent probe card architecture'20076,911,835'High performance probe system'2005

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2005–2010Patents assigned to FORMFACTOR INC (3)· patent assignee history
2005Based in Atwater, CA, US· patent location history
2007–2013Based in Copperopolis, CA, US· patent location history
2013Patents assigned to CHRAFT MATTHEW E (1)· patent assignee history
2013Patents assigned to HENSON ROY J (1)· patent assignee history
2013Patents assigned to MILLER CHARLES A (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
FORMFACTOR INC32005–2010
CHRAFT MATTHEW Eself12013
HENSON ROY J12013
MILLER CHARLES A12013
Locations
LocationPatentsSpan
Copperopolis, California, US32007–2013
Atwater, California, US12005