Inventor

Takao Kusaka

Inventor
Yokohama, JP

Overview

30→
Patents
1990–2019
Patent span
Electricity
Primary field (CPC H)

Patents· 30 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Fprimary
H01FMagnets13%
B01JChemical or physical processes, e.g. catalysis or colloid chemistry8%
G01QScanning-probe techniques or apparatus8%
B82YSpecific uses or applications of nanostructures7%
Y10TTechnical subjects covered by former us classification7%
B01DSeparation3%
H01JElectric discharge tubes or discharge lamps3%
H01MProcesses or means, e.g. batteries, for the direct conversion of chemical energy into electrical energy3%
H02JElectric power networks3%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution3%
PatentTitleYear
10,335,771Aqueous dispersion and coating material using the same, and photocatalytic film and product201910,327,445Antiviral material, antiviral film, antiviral fiber, and antiviral product201910,081,850Treatment method for solution containing metal ions using cation adsorbent201810,010,869Aqueous dispersion and coating material using the same, and photocatalytic film and product20189,919,292'Photocatalyst body, photocatalyst dispersion, and method for manufacturing photocatalyst body'20189,409,144'Cation adsorbent for solution treatment'20168,741,349'Antiviral material , antiviral film, antiviral fiber, and antiviral product'20148,283,888'Power receiver, and electronic apparatus and non-contact charger using same'20128,232,764'Power receiving device, and electronic apparatus and non-contact charging system using the same'20128,193,767'Power receiving device, and electronic apparatus and non-contact charger using the same'20128,062,441'High hardness, high corrosion resistance and high wear resistance alloy'20118,035,089'Scanning probe apparatus'20117,765,606'Scanning probe apparatus'20107,690,047'Scanning probe apparatus'20107,690,046'Drive stage for scanning probe apparatus, and scanning probe apparatus'20107,631,547'Scanning probe apparatus and drive stage therefor'20097,609,048'Probe microscope and measuring method using probe microscope'20097,569,817'Scanning probe apparatus'20097,504,924'Inductive device and method for manufacturing same'20096,480,084'Inductance element and manufacturing method thereof, and snubber using thereof'20026,366,014'Charge-up suppressing member, charge-up suppressing film, electron beam apparatus, and image forming apparatus'20026,342,754'Charge-reducing film, image forming apparatus including said film and method of manufacturing said image forming apparatus'20026,004,661'Amorphous magnetic material and magnetic core using the same'19995,939,824'Electron emitting device having a conductive thin film formed of at least two metal elements of difference ionic characteristics'19995,745,353'Snubber circuit that suppresses surge and rush current flowing to a switching element of a self excitation-type flyback power supply'19985,639,566'Magnetic core'19975,138,393'Magnetic core'19925,086,554'Method of manufacturing a magnetic core'19924,983,943'Magnetic core and method of manufacturing same'19914,958,134'Noise suppression device comprising a toroid winding'1990

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1990–2019Patents assigned to TOSHIBA KK (20)· patent assignee history
1990–2019Based in Yokohama, JP· patent location history
1991–1992Based in Tokyo, JP· patent location history
1998–2018Based in Kanagawa, JP· patent location history
1999–2011Patents assigned to CANON KK (10)· patent assignee history
2009–2019Patents assigned to TOSHIBA MATERIALS CO LTD (12)· patent assignee history
2011–2018Patents assigned to KUSAKA TAKAO (6)· patent assignee history
2012Patents assigned to INOUE TETSUO (3)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TOSHIBA KK201990–2019
TOSHIBA MATERIALS CO LTD122009–2019
CANON KK101999–2011
KUSAKA TAKAOself62011–2018
INOUE TETSUO32012
Locations
LocationPatentsSpan
Yokohama, JP261990–2019
Kanagawa, JP21998–2018
Tokyo, JP21991–1992