Inventor
Kinya Kobayashi
Inventor
Hitachi, JP
Overview
Patents· 32 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps30%
G01NInvestigating or analysing materials by determining their chemical or physical properties11%
G16CComputational chemistry7%
LOC127%
G16BBioinformatics, i.e. information and communication technology [ict] specially adapted for genetic or protein-related data processing in computational molecular biology5%
G06FElectric digital data processing4%
H01FMagnets4%
H02KDynamo-electric machines4%
Y10TTechnical subjects covered by former us classification4%
B24BMachines, devices, or processes for grinding or polishing2%
PatentTitleYear
10,998,117Wire-wound coil component and method for producing wire-wound coil component2021D0913864Front grill for an automobile2021D0913865Front grill for an automobile2021D0910892Front combination lamp for an automobile2021D0909932Front bumper for an automobile2021D0909933Front bumper for an automobile202110,910,143Winding-type coil component202110,883,301Control apparatus controlling opening and closing member for vehicle202110,318,679Calculation method of switching waveform of the inverter and circuit simulation model20199,257,259'Electron beam irradiation method and scanning electronic microscope'20169,143,025'Magnetic gear mechanism including a plurality of rotors or stators'20158,502,425'Totally enclosed motor'20138,482,148'Solar thermal power generation apparatus'20137,932,486'Mass spectrometer system'20117,595,484'Mass spectrometric method, mass spectrometric system, diagnosis system, inspection system, and mass spectrometric program'20097,544,930'Tandem type mass analysis system and method'20097,538,321'Method of identifying substances using mass spectrometry'20097,485,852'Mass analysis method and mass analysis apparatus'20097,473,892'Mass spectrometer system'20097,435,949'Mass spectrometric analysis method and system using the method'20087,332,713'Mass spectrometric method and mass spectrometric system'20087,180,056'Mass spectrometry and mass spectrometry system'20077,158,893'Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering system'20077,126,113'Mass spectrometry system'20066,957,159'System for analyzing compound structure'20056,926,816'Analysis method of film thickness distribution and design system of printed circuit board and manufacturing processes'20056,917,037'Mass spectrum analyzing system'20056,914,239'System for analyzing mass spectrometric data'20056,907,352'Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering system'20056,806,098'Method and device for assessing surface uniformity of semiconductor device treated by CMP'20046,745,134'Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering system'20046,511,588'Plating method using an additive'2003Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2003–2019Patents assigned to HITACHI LTD (11)· patent assignee history
2003–2016Based in Hitachi, JP· patent location history
2005–2016Patents assigned to HITACHI HIGH TECH CORP (12)· patent assignee history
2005–2021Based in Tokyo, JP· patent location history
2013–2016Patents assigned to KOBAYASHI KINYA (4)· patent assignee history
2013–2015Patents assigned to MATSUMOTO HIRONORI (2)· patent assignee history
2021Patents assigned to SUBARU CORP (5)· patent assignee history
2021Based in Nagaokakyo, JP· patent location history
2021Based in Ichinomiya, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 12 | 2005–2016 |
| HITACHI LTD | 11 | 2003–2019 |
| SUBARU CORP | 5 | 2021 |
| KOBAYASHI KINYAself | 4 | 2013–2016 |
| MATSUMOTO HIRONORI | 2 | 2013–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hitachi, JP | 20 | 2003–2016 |
| Tokyo, JP | 9 | 2005–2021 |
| Nagaokakyo, JP | 2 | 2021 |
| Ichinomiya, JP | 1 | 2021 |